Study of defects in electron irradiated CuInSe[sub 2] by positron lifetime spectroscopy

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dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorPolity, A.
dc.contributor.authorKrause-Rehberg, R.
dc.contributor.authorStaab, T. E. M.
dc.contributor.authorPuska, Martti J.
dc.contributor.authorKlais, J.
dc.contributor.authorMöller, H. J.
dc.contributor.authorMeyer, B. K.
dc.contributor.departmentTeknillisen fysiikan laitosfi
dc.contributor.departmentDepartment of Applied Physicsen
dc.contributor.schoolPerustieteiden korkeakoulufi
dc.contributor.schoolSchool of Scienceen
dc.date.accessioned2015-09-24T09:01:51Z
dc.date.available2015-09-24T09:01:51Z
dc.date.issued1998
dc.description.abstractCuInSe2 was studied in the as-grown state and after low-temperature (4 K) 2 MeV electron irradiation. The positron bulk lifetime of 235 ps was measured for the unirradiated sample. The positron bulk lifetime was theoretically calculated and is in good agreement with the experimental value. In addition, the defect-related lifetimes for mono-, di-, and trivacancies are theoretically determined. An increased average positron lifetime indicated after electron irradiation the appearance of open-volume defects, most probably of divacancy type. The disappearance of this defect was observed during annealing below 250 K. Other defects were formed leading to a divacancy signal at least stable up to 600 K in the temperature range above 450 K.en
dc.description.versionPeer revieweden
dc.format.extent71-78
dc.format.mimetypeapplication/pdfen
dc.identifier.citationPolity, A. & Krause-Rehberg, R. & Staab, T. E. M. & Puska, Martti J. & Klais, J. & Möller, H. J. & Meyer, B. K. 1998. Study of defects in electron irradiated CuInSe[sub 2] by positron lifetime spectroscopy. Journal of Applied Physics. Volume 83, Issue 1. 71-78. ISSN 0021-8979 (printed). DOI: 10.1063/1.366703.en
dc.identifier.doi10.1063/1.366703
dc.identifier.issn0021-8979 (printed)
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/17873
dc.identifier.urnURN:NBN:fi:aalto-201509234468
dc.language.isoenen
dc.publisherAIP Publishingen
dc.relation.ispartofseriesJournal of Applied Physicsen
dc.relation.ispartofseriesVolume 83, Issue 1
dc.rights© 1998 AIP Publishing. This article may be downloaded for personal use only. Any other use requires prior permission of the authors and the American Institute of Physics. The following article appeared in Journal of Applied Physics, Volume 83, Issue 1 and may be found at http://scitation.aip.org/content/aip/journal/jap/83/1/10.1063/1.366703.en
dc.rights.holderAIP Publishing
dc.subject.keywordpositron lifetimesen
dc.subject.keyworddefect chemistryen
dc.subject.otherPhysicsen
dc.titleStudy of defects in electron irradiated CuInSe[sub 2] by positron lifetime spectroscopyen
dc.typeA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessäfi
dc.type.dcmitypetexten
dc.type.versionFinal published versionen

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