Digital Metrology for the Internet of Things

dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorMustapää, Tuukkaen_US
dc.contributor.authorAutiosalo, Juusoen_US
dc.contributor.authorNikander, Pekkaen_US
dc.contributor.authorSiegel, Joshua E.en_US
dc.contributor.authorViitala, Raineen_US
dc.contributor.departmentDepartment of Energy and Mechanical Engineeringen
dc.contributor.departmentDepartment of Communications and Networkingen
dc.contributor.groupauthorNetwork Security and Trusten
dc.contributor.organizationMichigan State Universityen_US
dc.date.accessioned2020-08-06T12:13:07Z
dc.date.available2020-08-06T12:13:07Z
dc.date.issued2020-06-17en_US
dc.description.abstractInternet of Things (IoT) device data enables diverse applications. However, the quality of data are non-standardized and difficult to quantify. While poor quality data may be usable, establishing error bounds supports IoT’s use in critical applications. National Metrology Institutes (NMIs) have long tradition in making measurement data trustworthy, and they are now working to digitalize these practices. This paper forwards that agenda by presenting a Distributed Ledger Technology (DLT) based concept to leverage digital metrology for IoT data and devices. Digital Calibration Certificates (DCCs) offer a solution for describing, certifying, authenticating, and securing IoT data quality. With DCCs, measurement device (sensor) calibration information may be included as metadata alongside samples captured by a device. Metadata may include device identification, which serves as proof-of-origin for measurements and samples, and timing data, to ensure its “freshness.” DCCs enhance communicating the quality of captured information among devices, services, and applications, thereby supporting IoT’s use in domains with strict error constraints. Our proposed concept securely validates DCC-based (meta)data traceability chain from NMIs and devices to data end-users with cryptographic measures, rendering IoT data trustworthy for critical applications.en
dc.description.versionPeer revieweden
dc.format.extent6
dc.format.mimetypeapplication/pdfen_US
dc.identifier.citationMustapää, T, Autiosalo, J, Nikander, P, Siegel, J E & Viitala, R 2020, Digital Metrology for the Internet of Things. in GIoTS 2020 - Global Internet of Things Summit, Proceedings., 9119603, IEEE, Global Internet of Things Summit, Dublin, Ireland, 03/06/2020. https://doi.org/10.1109/GIOTS49054.2020.9119603en
dc.identifier.doi10.1109/GIOTS49054.2020.9119603en_US
dc.identifier.isbn9781728121710
dc.identifier.otherPURE UUID: 3e5fa46e-525d-4c81-a46e-290e08d5f904en_US
dc.identifier.otherPURE ITEMURL: https://research.aalto.fi/en/publications/3e5fa46e-525d-4c81-a46e-290e08d5f904en_US
dc.identifier.otherPURE LINK: http://www.scopus.com/inward/record.url?scp=85087386136&partnerID=8YFLogxK
dc.identifier.otherPURE FILEURL: https://research.aalto.fi/files/44612120/ENG_Mustap_et_al_Digital_Metrology_for_Global_Inernet_of_Things_Summit.pdfen_US
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/45504
dc.identifier.urnURN:NBN:fi:aalto-202008064463
dc.language.isoenen
dc.relation.ispartofGlobal Internet of Things Summiten
dc.relation.ispartofseriesGIoTS 2020 - Global Internet of Things Summit, Proceedingsen
dc.rightsopenAccessen
dc.subject.keywordIoTen_US
dc.subject.keywordmetrologyen_US
dc.subject.keyworddigital calibration certificateen_US
dc.subject.keywordsecurityen_US
dc.subject.keyworddigital twinen_US
dc.titleDigital Metrology for the Internet of Thingsen
dc.typeA4 Artikkeli konferenssijulkaisussafi
dc.type.versionacceptedVersion

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