Setup for shot noise measurements in carbon nanotubes

dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorWu, F.
dc.contributor.authorRoschier, L.
dc.contributor.authorTsuneta, T.
dc.contributor.authorPaalanen, M.
dc.contributor.authorWang, T. H.
dc.contributor.authorHakonen, Pertti J.
dc.contributor.departmentTeknillisen fysiikan laitosfi
dc.contributor.departmentDepartment of Applied Physicsen
dc.contributor.schoolPerustieteiden korkeakoulufi
dc.contributor.schoolSchool of Scienceen
dc.date.accessioned2015-10-17T09:01:36Z
dc.date.available2015-10-17T09:01:36Z
dc.date.issued2006
dc.description.abstractWe have constructed a noise measurement setup for high impedance carbon nanotube samples. Our setup, working in the frequency range of 600 – 900 MHz, takes advantage of the fact that the shot noise power is reasonably large for high impedance sources so that relatively large, fixed non‐matching conditions can be tolerated.en
dc.description.versionPeer revieweden
dc.format.extent1482-1483
dc.format.mimetypeapplication/pdfen
dc.identifier.citationWu, F. & Roschier, L. & Tsuneta, T. & Paalanen, M. & Wang, T. H. & Hakonen, Pertti J. 2006. Setup for shot noise measurements in carbon nanotubes. 24th International Conference on Low Temperature Physics. AIP Conference Proceedings. 850. 1482-1483. ISBN 0-7354-0347-3 (printed).en
dc.identifier.isbn0-7354-0347-3 (printed)
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/18175
dc.identifier.urnURN:NBN:fi:aalto-201510164617
dc.language.isoenen
dc.publisherAalto Universityen
dc.publisherAalto-yliopistofi
dc.relation.ispartof24th International Conference on Low Temperature Physicsen
dc.relation.ispartofseriesAIP Conference Proceedingsen
dc.relation.ispartofseries850
dc.rights© 2006 AIP Publishing. Copyright of AIP Conference Proceedings is the property of American Institute of Physics and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use.en
dc.rights.holderAIP Publishingen
dc.subject.keywordcarbon nanotubesen
dc.subject.keywordmicrowave frequencyen
dc.subject.keywordshot noiseen
dc.subject.otherPhysicsen
dc.titleSetup for shot noise measurements in carbon nanotubesen
dc.typeA4 Artikkeli konferenssijulkaisussafi
dc.type.dcmitypetexten
dc.type.versionFinal published versionen
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