Setup for shot noise measurements in carbon nanotubes
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School of Science |
A4 Artikkeli konferenssijulkaisussa
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Date
2006
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Degree programme
Language
en
Pages
1482-1483
Series
AIP Conference Proceedings, 850
Abstract
We have constructed a noise measurement setup for high impedance carbon nanotube samples. Our setup, working in the frequency range of 600 – 900 MHz, takes advantage of the fact that the shot noise power is reasonably large for high impedance sources so that relatively large, fixed non‐matching conditions can be tolerated.Description
Keywords
carbon nanotubes, microwave frequency, shot noise
Other note
Citation
Wu, F. & Roschier, L. & Tsuneta, T. & Paalanen, M. & Wang, T. H. & Hakonen, Pertti J. 2006. Setup for shot noise measurements in carbon nanotubes. 24th International Conference on Low Temperature Physics. AIP Conference Proceedings. 850. 1482-1483. ISBN 0-7354-0347-3 (printed).