Measuring Electric Field Induced Subpicometer Displacement of Step Edge Ions

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Journal Title

Journal ISSN

Volume Title

A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä

Date

2012

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Mcode

Degree programme

Language

en

Pages

5
1-5

Series

PHYSICAL REVIEW LETTERS, Volume 109, issue 14

Abstract

We provide unambiguous evidence that the applied electrostatic field displaces step atoms of ionic crystal surfaces by subpicometers in different directions via the measurement of the lateral force interactions by bimodal dynamic force microscopy combined with multiscale theoretical simulations. Such a small imbalance in the electrostatic interaction of the shifted anion-cation ions leads to an extraordinary long-range feature potential variation and is now detectable with the extreme sensitivity of the bimodal detection.

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Keywords

AFM, KPFM, NaCl, AFM, KPFM, NaCl

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Citation

Kawai , S , F. Canova , F , Glatzel , T , Hynninen , T , Meyer , E & Foster , A S 2012 , ' Measuring Electric Field Induced Subpicometer Displacement of Step Edge Ions ' , Physical Review Letters , vol. 109 , no. 14 , 146101 , pp. 1-5 . https://doi.org/10.1103/PhysRevLett.109.146101