Atomic/molecular layer deposition of Cu-organic thin films
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A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
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en
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10
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Dalton Transactions, Volume 47, issue 44, pp. 15791-15800
Abstract
The gas-phase atomic/molecular layer deposition (ALD/MLD) technique is strongly emerging as a viable approach to fabricate new exciting inorganic-organic hybrid thin-film materials. However, much less effort has been made to develop new precursors specifically intended for ALD/MLD; this applies to both the organic and inorganic precursors, and in the latter case in particular to transition metal precursors. Here we introduce copper bisdimethylaminopropoxide (Cu(dmap)2) as a promising transition metal precursor for ALD/MLD to be combined with a variety of organic precursors with different backbones and functional groups, i.e. hydroquinone (HQ), terephthalic acid (TPA), 4,4′-oxydianiline (ODA), p-phenylenediamine (PPDA) and 1,4-benzenedithiol (BDT). Hybrid Cu-organic thin films were obtained from all five organic precursors with appreciably high growth rates ranging from 1.0 to 2.6 Å per cycle. However, the Cu(dmap)2 + HQ process was found to yield hybrid Cu-organic films only at temperatures below 120 °C, while at higher temperatures metallic Cu films were obtained. The films were characterized by XRR, GIXRD, FTIR, Raman, XPS and UV-Vis spectroscopy.Description
| openaire: EC/FP7/339478/EU//LAYERENG-HYBMAT
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Hagen, D J, Mai, L, Devi, A, Sainio, J & Karppinen, M 2018, 'Atomic/molecular layer deposition of Cu-organic thin films', Dalton Transactions, vol. 47, no. 44, pp. 15791-15800. https://doi.org/10.1039/C8DT03735C