Optimization of two-level deep reactive ion etching process
| dc.contributor | Aalto-yliopisto | fi |
| dc.contributor | Aalto University | en |
| dc.contributor.advisor | Savolainen, Kari | |
| dc.contributor.author | Reini, Vesa | |
| dc.contributor.department | Kemian ja materiaalitieteiden tiedekunta | fi |
| dc.contributor.school | Kemian tekniikan korkeakoulu | fi |
| dc.contributor.school | School of Chemical Engineering | en |
| dc.contributor.supervisor | Paulasto-Kröckel, Mervi | |
| dc.date.accessioned | 2020-12-23T13:18:39Z | |
| dc.date.available | 2020-12-23T13:18:39Z | |
| dc.date.issued | 2010 | |
| dc.format.extent | viii + 84 + [9] | |
| dc.identifier.uri | https://aaltodoc.aalto.fi/handle/123456789/99137 | |
| dc.identifier.urn | URN:NBN:fi:aalto-2020122357964 | |
| dc.language.iso | fi | en |
| dc.programme.major | Elektroniikan valmistustekniikka | fi |
| dc.programme.mcode | S-113 | fi |
| dc.rights.accesslevel | closedAccess | |
| dc.subject.keyword | DRIE | en |
| dc.subject.keyword | DRIE | fi |
| dc.subject.keyword | 2-level masking | en |
| dc.subject.keyword | tuplamaskaus | fi |
| dc.subject.keyword | Si residual | en |
| dc.subject.keyword | piijäämä | fi |
| dc.subject.keyword | Bosch process | en |
| dc.subject.keyword | Bosch-prosessi | fi |
| dc.title | Optimization of two-level deep reactive ion etching process | en |
| dc.title | Reaktiivisen ionisyväetsauksen tuplamaskausprosessin optimointi | fi |
| dc.type.okm | G2 Pro gradu, diplomityö | |
| dc.type.ontasot | Master's thesis | en |
| dc.type.ontasot | Pro gradu -tutkielma | fi |
| dc.type.publication | masterThesis | |
| local.aalto.digiauth | ask | |
| local.aalto.digifolder | Aalto_04607 | |
| local.aalto.idinssi | 47441 | |
| local.aalto.inssiarchivenr | 272 | |
| local.aalto.inssilocation | P1 Ark Aalto | |
| local.aalto.openaccess | no |