Compensating vacancy defects in Sn- and Mg-doped In 2O3
| dc.contributor | Aalto-yliopisto | fi |
| dc.contributor | Aalto University | en |
| dc.contributor.author | Korhonen, E. | |
| dc.contributor.author | Tuomisto, Filip | |
| dc.contributor.author | Bierwagen, O. | |
| dc.contributor.author | Speck, J. S. | |
| dc.contributor.author | Galazka, Z. | |
| dc.contributor.department | Teknillisen fysiikan laitos | fi |
| dc.contributor.department | Department of Applied Physics | en |
| dc.contributor.school | Perustieteiden korkeakoulu | fi |
| dc.contributor.school | School of Science | en |
| dc.date.accessioned | 2015-08-26T09:01:42Z | |
| dc.date.available | 2015-08-26T09:01:42Z | |
| dc.date.issued | 2014 | |
| dc.description.abstract | MBE-grown Sn- and Mg-doped epitaxial In2O3 thin-film samples with varying doping concentrations have been measured using positron Doppler spectroscopy and compared to a bulk crystal reference. Samples were subjected to oxygen or vacuum annealing and the effect on vacancy type defects was studied. Results indicate that after oxygen annealing the samples are dominated by cation vacancies, the concentration of which changes with the amount of doping. In highly Sn-doped In2O3, however, these vacancies are not the main compensating acceptor. Vacuum annealing increases the size of vacancies in all samples, possibly by clustering them with oxygen vacancies. | en |
| dc.description.version | Peer reviewed | en |
| dc.format.extent | 245307/1-7 | |
| dc.format.mimetype | application/pdf | en |
| dc.identifier.citation | Korhonen, E. & Tuomisto, Filip & Bierwagen, O. & Speck, J. S. & Galazka, Z. 2014. Compensating vacancy defects in Sn- and Mg-doped In 2O3. Physical Review B. Volume 90, Issue 24. 245307/1-7. ISSN 1098-0121 (printed). DOI: 10.1103/physrevb.90.245307 | en |
| dc.identifier.doi | 10.1103/physrevb.90.245307 | |
| dc.identifier.issn | 1098-0121 (printed) | |
| dc.identifier.uri | https://aaltodoc.aalto.fi/handle/123456789/17502 | |
| dc.identifier.urn | URN:NBN:fi:aalto-201508264117 | |
| dc.language.iso | en | en |
| dc.publisher | American Physical Society (APS) | en |
| dc.relation.ispartofseries | Physical Review B | en |
| dc.relation.ispartofseries | Volume 90, Issue 24 | |
| dc.rights | © 2014 American Physical Society (APS). This is the accepted version of the following article: Korhonen, E. & Tuomisto, Filip & Bierwagen, O. & Speck, J. S. & Galazka, Z. 2014. Compensating vacancy defects in Sn- and Mg-doped In 2O3. Physical Review B. Volume 90, Issue 24. 245307/1-7. ISSN 1098-0121 (printed). DOI: 10.1103/physrevb.90.245307, which has been published in final form at http://journals.aps.org/prb/abstract/10.1103/PhysRevB.90.245307. | en |
| dc.rights.holder | American Physical Society (APS) | |
| dc.subject.keyword | In2O3 | en |
| dc.subject.keyword | vacancies | en |
| dc.subject.keyword | positrons | en |
| dc.subject.other | Physics | en |
| dc.title | Compensating vacancy defects in Sn- and Mg-doped In 2O3 | en |
| dc.type | A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä | fi |
| dc.type.dcmitype | text | en |
| dc.type.version | Final published version | en |
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