Defect structures in highly Sb-doped silicon studied with positron Doppler-spectroscopy

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dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.advisorRanki, Ville 
dc.contributor.authorRummukainen, Mikko
dc.contributor.departmentTeknillisen fysiikan ja matematiikan osastofi
dc.contributor.schoolTeknillinen korkeakoulufi
dc.contributor.schoolHelsinki University of Technologyen
dc.contributor.supervisorSaarinen, Kimmo 
dc.date.accessioned2020-12-04T15:41:12Z
dc.date.available2020-12-04T15:41:12Z
dc.date.issued2003 
dc.format.extentiv + 74 
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/90611
dc.identifier.urnURN:NBN:fi:aalto-2020120449446
dc.language.isofien
dc.programme.majorFysiikkafi
dc.programme.mcodeTfy-3fi
dc.rights.accesslevelclosedAccess
dc.subject.keywordpositron spectroscopyen
dc.subject.keywordpositronispektroskopiafi
dc.subject.keyworddopingen
dc.subject.keywordseostusfi
dc.subject.keywordsiliconen
dc.subject.keywordpiifi
dc.subject.keywordcompensationen
dc.subject.keywordkompensaatiofi
dc.subject.keyworddefecten
dc.subject.keywordhilavirhefi
dc.titleDefect structures in highly Sb-doped silicon studied with positron Doppler-spectroscopyen
dc.titleVoimakkaasti Sb-seostetun piin hilavirheiden tutkiminen positronien Doppler-spektroskopiallafi
dc.type.okmG2 Pro gradu, diplomityö 
dc.type.ontasotMaster's thesisen
dc.type.ontasotPro gradu -tutkielmafi
dc.type.publicationmasterThesis 
local.aalto.digiauthask
local.aalto.digifolderAalto_43202
local.aalto.idinssi19564
local.aalto.openaccessno

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