Unambiguous Interpretation of Atomically Resolved Force Microscopy Images of an Insulator
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© 2001 American Physical Society (APS). This is the accepted version of the following article: Foster, Adam S. ; Barth, C. ; Shluger, A. L. ; Reichling, M.. 2001. Unambiguous Interpretation of Atomically Resolved Force Microscopy Images of an Insulator. Physical Review Letters. Volume 86, Issue 11. 2373-2376. ISSN 0031-9007 (printed). DOI: 10.1103/physrevlett.86.2373, which has been published in final form at http://journals.aps.org/prl/pdf/10.1103/PhysRevLett.86.2373.
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School of Science |
A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
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Date
2001
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Mcode
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Language
en
Pages
2373-2376
Series
Physical Review Letters, Volume 86, Issue 11
Abstract
The (111) surface of CaF2 was imaged with dynamic mode scanning force microscopy and modeledusing atomistic simulation. Both experiment and theory showed a clear triangular contrast pattern in images, and theory demonstrated that the contrast pattern is due to the interaction of a positive electrostatic potential tip with fluorine ions in the two topmost surface layers. We find a good agreement of position and relative height of scan line features between theory and experiment and thus establish for the first time an unambiguous identification of sublattices of an insulator imaged by force microscopy.Description
Keywords
AFM, simulation, insulators
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Citation
Foster, Adam S. & Barth, C. & Shluger, A. L. & Reichling, M.. 2001. Unambiguous Interpretation of Atomically Resolved Force Microscopy Images of an Insulator. Physical Review Letters. Volume 86, Issue 11. 2373-2376. ISSN 0031-9007 (printed). DOI: 10.1103/physrevlett.86.2373.