Towards chemical identification in atomic-resolution noncontact AFM imaging with silicon tips
Loading...
Access rights
© 2003 American Physical Society (APS). This is the accepted version of the following article: Foster, A. S. & Gal, A. Y. & Airaksinen, J. M. & Pakarinen, O. H. & Lee, Y. J. & Gale, J. D. & Shluger, A. L. & Nieminen, Risto M. 2003. Towards chemical identification in atomic-resolution noncontact AFM imaging with silicon tips. Physical Review B. Volume 68, Issue 19. 195420-1-8. ISSN 1550-235X (electronic). DOI: 10.1103/physrevb.68.195420, which has been published in final form at http://journals.aps.org/prb/abstract/10.1103/PhysRevB.68.195420.
URL
Journal Title
Journal ISSN
Volume Title
School of Science |
A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
Unless otherwise stated, all rights belong to the author. You may download, display and print this publication for Your own personal use. Commercial use is prohibited.
Date
2003
Major/Subject
Mcode
Degree programme
Language
en
Pages
195420-1-8
Series
Physical Review B, Volume 68, Issue 19
Abstract
In this study we use ab initio calculations and a pure silicon tip to study the tip-surface interaction with four characteristic insulating surfaces: (i) the narrow gap TiO2 (110) surface, (ii) the classic oxide MgO (001) surface, (iii) the ionic solid CaCO3 (101¯4) surface with molecular anion, and (iv) the wide gap CaF2 (111) surface. Generally we find that the tip-surface interaction strongly depends on the surface electronic structure due to the dominance of covalent bond formation with the silicon tip. However, we also find that in every case the strongest interaction is with the highest anion of the surface. This result suggests that, if the original silicon tip can be carefully controlled, it should be possible to immediately identify the species seen as bright in images of insulating surfaces. In order to provide a more complete picture we also compare these results to those for contaminated tips and suggest how applied voltage could also be used to probe chemical identity.Description
Keywords
ab initio calculations, pure silicon tip, insulating surfaces, tip-surface interactions
Other note
Citation
Foster, A. S. & Gal, A. Y. & Airaksinen, J. M. & Pakarinen, O. H. & Lee, Y. J. & Gale, J. D. & Shluger, A. L. & Nieminen, Risto M. 2003. Towards chemical identification in atomic-resolution noncontact AFM imaging with silicon tips. Physical Review B. Volume 68, Issue 19. 195420-1-8. ISSN 1550-235X (electronic). DOI: 10.1103/physrevb.68.195420.