Investigation of Conductive ZnO/Al2O3 Nanolaminates grown by Atomic Layer Deposition
| dc.contributor | Aalto-yliopisto | fi |
| dc.contributor | Aalto University | en |
| dc.contributor.advisor | Tiilikainen, Jouni | |
| dc.contributor.author | Xu, Tingmo | |
| dc.contributor.department | Sähkö- ja tietoliikennetekniikan osasto | fi |
| dc.contributor.school | Teknillinen korkeakoulu | fi |
| dc.contributor.school | Helsinki University of Technology | en |
| dc.contributor.supervisor | Hakkarainen, Teppo | |
| dc.date.accessioned | 2020-12-05T11:10:08Z | |
| dc.date.available | 2020-12-05T11:10:08Z | |
| dc.date.issued | 2007 | |
| dc.format.extent | v + 49 | |
| dc.identifier.uri | https://aaltodoc.aalto.fi/handle/123456789/95194 | |
| dc.identifier.urn | URN:NBN:fi:aalto-2020120554028 | |
| dc.language.iso | en | en |
| dc.programme.major | Optiikka ja molekyylimateriaalit | fi |
| dc.programme.mcode | S-129 | fi |
| dc.rights.accesslevel | closedAccess | |
| dc.subject.keyword | aluminium oxide | en |
| dc.subject.keyword | atomic layer deposition | en |
| dc.subject.keyword | nanolaminates | en |
| dc.subject.keyword | TML | en |
| dc.subject.keyword | X-ray reflectivity | en |
| dc.subject.keyword | zinc oxide | en |
| dc.title | Investigation of Conductive ZnO/Al2O3 Nanolaminates grown by Atomic Layer Deposition | en |
| dc.type.okm | G2 Pro gradu, diplomityö | |
| dc.type.ontasot | Master's thesis | en |
| dc.type.ontasot | Pro gradu -tutkielma | fi |
| dc.type.publication | masterThesis | |
| local.aalto.digiauth | ask | |
| local.aalto.digifolder | Aalto_38459 | |
| local.aalto.idinssi | 35303 | |
| local.aalto.inssilocation | P1 Ark S80 | |
| local.aalto.openaccess | no |