Single-charge escape processes through a hybrid turnstile in a dissipative environment

dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorLotkhov, S.V.
dc.contributor.authorSaira, O.P.
dc.contributor.authorPekola, J.P.
dc.contributor.authorZorin, A.B.
dc.contributor.departmentDepartment of Applied Physicsen
dc.contributor.groupauthorQuantum Computing and Devicesen
dc.date.accessioned2018-05-22T14:47:25Z
dc.date.available2018-05-22T14:47:25Z
dc.date.issued2011-01-26
dc.description.abstractWe have investigated the static, charge-trapping properties of a hybrid superconductor–normal metal electron turnstile embedded in a high-ohmic environment. The device includes a local Cr resistor on one side of the turnstile, and a superconducting trapping island on the other side. The electron hold times, τ~2–20 s, in our two-junction circuit are comparable with those of typical multi-junction, N≥4, normal-metal single-electron tunneling devices. A semi-phenomenological model of the environmental activation of tunneling is applied for the analysis of the switching statistics. The experimental results are promising for electrical metrology applications.en
dc.description.versionPeer revieweden
dc.format.extent14
dc.format.mimetypeapplication/pdf
dc.identifier.citationLotkhov, S V, Saira, O P, Pekola, J P & Zorin, A B 2011, 'Single-charge escape processes through a hybrid turnstile in a dissipative environment', New Journal of Physics, vol. 13, 013040, pp. 1-14. https://doi.org/10.1088/1367-2630/13/1/013040en
dc.identifier.doi10.1088/1367-2630/13/1/013040
dc.identifier.issn1367-2630
dc.identifier.otherPURE UUID: c0eb121f-6cde-44b8-af11-0e7eeaaf8263
dc.identifier.otherPURE ITEMURL: https://research.aalto.fi/en/publications/c0eb121f-6cde-44b8-af11-0e7eeaaf8263
dc.identifier.otherPURE LINK: http://dx.doi.org/10.1088/1367-2630/13/1/013040
dc.identifier.otherPURE FILEURL: https://research.aalto.fi/files/13422467/Lotkhov_2011_New_J._Phys._13_013040.pdf
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/31148
dc.identifier.urnURN:NBN:fi:aalto-201805222588
dc.language.isoenen
dc.publisherInstitute of Physics Publishing
dc.relation.ispartofseriesNew Journal of Physicsen
dc.relation.ispartofseriesVolume 13, pp. 1-14en
dc.rightsopenAccessen
dc.subject.keywordcircuits
dc.subject.keywordCoulomb-clockade
dc.subject.keyworddevice
dc.subject.keywordelectron pump
dc.subject.keywordfluctuations
dc.subject.keywordon-chip resistors
dc.subject.keywordtrap
dc.subject.keywordtunnel-junctions
dc.titleSingle-charge escape processes through a hybrid turnstile in a dissipative environmenten
dc.typeA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessäfi
dc.type.versionpublishedVersion

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