Robust Bessel-function-based method for determination of the (n, m) indices of single-walled carbon nanotubes by electron diffraction

Loading...
Thumbnail Image
Access rights
© 2006 American Physical Society (APS). This is the accepted version of the following article: Jiang, Hua & Brown, David P. & Nasibulin, Albert G. & Kauppinen, Esko I. 2006. Robust Bessel-function-based method for determination of the (n, m) indices of single-walled carbon nanotubes by electron diffraction. Physical Review B. Volume 74, Issue 3. 035427/1-8. ISSN 1098-0121 (printed). DOI: 10.1103/physrevb.74.035427, which has been published in final form at http://journals.aps.org/prb/abstract/10.1103/PhysRevB.74.035427
Journal Title
Journal ISSN
Volume Title
School of Science | A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
Date
2006
Department
Teknillisen fysiikan laitos
Department of Applied Physics
Major/Subject
Mcode
Degree programme
Language
en
Pages
035427/1-8
Series
Physical Review B, Volume 74, Issue 3
Abstract
We report a calibration-free method for the determination of chiral indices (n,m) of single-walled carbon nanotubes from their electron diffraction patterns based on Bessel function analysis of the diffracted layer lines. An approach has been developed for confident identification of the orders of the Bessel functions from the intensity modulations of the diffraction layer lines, to which (n,m) are correlated. In particular, we critically evaluate the effect of nanotube inclination on the validity of the method and show that the layer lines governed by high-order Bessel functions tolerate higher tilt angles than those of low-order Bessel functions and thus are favored for (n,m) evaluation. The method is of particular significance in that it considerably enhances the precision of chiral indexing and makes possible the analysis of high-order Bessel functions, especially when EDPs are of relatively low pixel resolution. The technique can be extended to structural analysis of double-walled carbon nanotubes.
Description
Keywords
single-walled carbon nanotubes, chiral indices, determination
Other note
Citation
Jiang, Hua & Brown, David P. & Nasibulin, Albert G. & Kauppinen, Esko I. 2006. Robust Bessel-function-based method for determination of the (n, m) indices of single-walled carbon nanotubes by electron diffraction. Physical Review B. Volume 74, Issue 3. 035427/1-8. ISSN 1098-0121 (printed). DOI: 10.1103/physrevb.74.035427