Aberration-insensitive microscopy using optical field-correlation imaging

dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorIlina, E.
dc.contributor.authorNyman, M.
dc.contributor.authorŠvagždyte, I.
dc.contributor.authorChekurov, N.
dc.contributor.authorKaivola, M.
dc.contributor.authorSetälä, T.
dc.contributor.authorShevchenko, A.
dc.contributor.departmentDepartment of Applied Physics
dc.contributor.departmentVilnius Gediminas Technical University
dc.contributor.departmentOxford Instruments Group Plc
dc.contributor.departmentUniversity of Eastern Finland
dc.contributor.departmentOptics and Photonics
dc.date.accessioned2019-07-30T07:19:44Z
dc.date.available2019-07-30T07:19:44Z
dc.date.issued2019-06-01
dc.description.abstractThe possibility to reduce the effect of optical aberrations has been proposed in several publications on classical ghost imaging. The two-armed ghost-imaging systems make use of spatially incoherent illumination and point-by-point scanned intensity-correlation measurements in the arms. In this work, we introduce a novel ghostlike imaging method that uses a Mach-Zehnder interferometer and is based on optical-field interference instead of intensity correlations. The method allows us to obtain sharp images of microscopic objects even in the presence of severe aberrations that completely destroy the intensity-based image. Furthermore, pure phase objects can be imaged with micrometer-scale resolution in the presence of strong aberrations, which has not been demonstrated previously with a correlation-based imaging technique. In the setup, we use a light-emitting diode source and an ordinary camera as the only light detector. The imaging approach that we put forward in this work may find significant applications in advanced optical microscopy, optical coherence tomography, and a variety of interferometric sensors and detectors.en
dc.description.versionPeer revieweden
dc.format.extent1-7
dc.format.mimetypeapplication/pdf
dc.identifier.citationIlina , E , Nyman , M , Švagždyte , I , Chekurov , N , Kaivola , M , Setälä , T & Shevchenko , A 2019 , ' Aberration-insensitive microscopy using optical field-correlation imaging ' , APL Photonics , vol. 4 , no. 6 , 066102 , pp. 1-7 . https://doi.org/10.1063/1.5091976en
dc.identifier.doi10.1063/1.5091976
dc.identifier.issn2330-4022
dc.identifier.otherPURE UUID: b56f3e2f-bae5-4586-8423-260862254da9
dc.identifier.otherPURE ITEMURL: https://research.aalto.fi/en/publications/b56f3e2f-bae5-4586-8423-260862254da9
dc.identifier.otherPURE LINK: http://www.scopus.com/inward/record.url?scp=85067395683&partnerID=8YFLogxK
dc.identifier.otherPURE FILEURL: https://research.aalto.fi/files/35124239/1.5091976.pdf
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/39493
dc.identifier.urnURN:NBN:fi:aalto-201907304548
dc.language.isoenen
dc.publisherACS Publications
dc.relation.ispartofseriesAPL Photonicsen
dc.relation.ispartofseriesVolume 4, issue 6en
dc.rightsopenAccessen
dc.titleAberration-insensitive microscopy using optical field-correlation imagingen
dc.typeA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessäfi
dc.type.versionpublishedVersion
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