Leakage current of a superconductor-normal metal tunnel junction connected to a high-temperature environment

dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorDi Marco, A.
dc.contributor.authorMaisi, Ville
dc.contributor.authorPekola, J.P.
dc.contributor.authorHekking, F.W.J.
dc.contributor.departmentDepartment of Applied Physics
dc.date.accessioned2018-05-22T14:53:51Z
dc.date.available2018-05-22T14:53:51Z
dc.date.issued2013-11-11
dc.description.abstractWe consider a voltage-biased normal metal-insulator-superconductor (NIS) tunnel junction, connected to a high-temperature external electromagnetic environment. This model system features the commonly observed subgap leakage current in NIS junctions through photon-assisted tunneling which is detrimental for applications. We first consider a NIS junction directly coupled to the environment and analyze the subgap leakage current both analytically and numerically; we discuss the link with the phenomenological Dynes parameter. Then, we focus on a circuit where a low-temperature lossy transmission line is inserted between the NIS junction and the environment. We show that the amplitude of the transmitted frequencies relevant for the photon-assisted tunneling is exponentially suppressed as the length ℓ and the resistance per unit length R0 of the line are increased. Consequently, the subgap current is reduced exponentially as well. This property can not be obtained by means of lumped circuit elements. We finally discuss our results in view of the performance of NIS junctions in applications.en
dc.description.versionPeer revieweden
dc.format.extent9
dc.format.extent1-9
dc.format.mimetypeapplication/pdf
dc.identifier.citationDi Marco , A , Maisi , V , Pekola , J P & Hekking , F W J 2013 , ' Leakage current of a superconductor-normal metal tunnel junction connected to a high-temperature environment ' , Physical Review B , vol. 88 , no. 17 , 174507 , pp. 1-9 . https://doi.org/10.1103/PhysRevB.88.174507en
dc.identifier.doi10.1103/PhysRevB.88.174507
dc.identifier.issn1098-0121
dc.identifier.issn1550-235X
dc.identifier.otherPURE UUID: f997204d-73de-4640-84a9-58b6c8c7a4c3
dc.identifier.otherPURE ITEMURL: https://research.aalto.fi/en/publications/f997204d-73de-4640-84a9-58b6c8c7a4c3
dc.identifier.otherPURE FILEURL: https://research.aalto.fi/files/13422595/PhysRevB.88.174507.pdf
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/31285
dc.identifier.urnURN:NBN:fi:aalto-201805222725
dc.language.isoenen
dc.relation.ispartofseriesPHYSICAL REVIEW Ben
dc.relation.ispartofseriesVolume 88, issue 17en
dc.rightsopenAccessen
dc.subject.keywordISLAND
dc.subject.keywordNOISE
dc.subject.keywordREFRIGERATION
dc.subject.keywordSINGLE-ELECTRON TRANSISTOR
dc.subject.keywordTHERMOMETRY
dc.titleLeakage current of a superconductor-normal metal tunnel junction connected to a high-temperature environmenten
dc.typeA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessäfi
dc.type.versionpublishedVersion
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