Statistics of electron tunneling in normal tunnel junctions: An analytical and numerical study including circuit effects

dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorHakonen, Pertti J.
dc.contributor.authorPaila, A.
dc.contributor.authorSonin, E. B.
dc.contributor.departmentTeknillisen fysiikan laitosfi
dc.contributor.departmentDepartment of Applied Physicsen
dc.contributor.schoolPerustieteiden korkeakoulufi
dc.contributor.schoolSchool of Scienceen
dc.date.accessioned2015-09-10T09:01:28Z
dc.date.available2015-09-10T09:01:28Z
dc.date.issued2006
dc.description.abstractStatistics of electron tunneling in normal tunnel junctions is studied analytically and numerically taking into account circuit (environment) effects. Full counting statistics, as well as full statistics of voltage and phase have been found for arbitrary times of observation. The theoretical analysis was based on the classical master equation, whereas the numerical simulations employed standard Monte-Carlo methods.en
dc.description.versionPeer revieweden
dc.format.extent195322/1-8
dc.format.mimetypeapplication/pdfen
dc.identifier.citationHakonen, Pertti J. & Paila, A. & Sonin, E. B. 2006. Statistics of electron tunneling in normal tunnel junctions: An analytical and numerical study including circuit effects. Physical Review B. Volume 74, Issue 19. 195322/1-8. ISSN 1098-0121 (printed). DOI: 10.1103/physrevb.74.195322en
dc.identifier.doi10.1103/physrevb.74.195322
dc.identifier.issn1098-0121 (printed)
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/17628
dc.identifier.urnURN:NBN:fi:aalto-201509094238
dc.language.isoenen
dc.publisherAmerican Physical Society (APS)en
dc.relation.ispartofseriesPhysical Review Ben
dc.relation.ispartofseriesVolume 74, Issue 19
dc.rights© 2006 American Physical Society (APS). This is the accepted version of the following article: Hakonen, Pertti J. & Paila, A. & Sonin, E. B. 2006. Statistics of electron tunneling in normal tunnel junctions: An analytical and numerical study including circuit effects. Physical Review B. Volume 74, Issue 19. 195322/1-8. ISSN 1098-0121 (printed). DOI: 10.1103/physrevb.74.195322, which has been published in final form at http://journals.aps.org/prb/abstract/10.1103/PhysRevB.74.195322.en
dc.rights.holderAmerican Physical Society (APS)
dc.subject.keywordelectron tunnelingen
dc.subject.keywordnormal tunnel junctionen
dc.subject.keywordcircuit effecten
dc.subject.otherPhysicsen
dc.titleStatistics of electron tunneling in normal tunnel junctions: An analytical and numerical study including circuit effectsen
dc.typeA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessäfi
dc.type.dcmitypetexten
dc.type.versionFinal published versionen
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