Characterizing Complex Permittivity of Thin Materials by Free Space Transmission and Reflection Coefficients

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dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorXue, Bingen_US
dc.contributor.departmentDepartment of Electronics and Nanoengineeringen
dc.contributor.groupauthorKatsuyuki Haneda Groupen
dc.date.accessioned2024-09-17T21:26:30Z
dc.date.available2024-09-17T21:26:30Z
dc.date.issued2024en_US
dc.descriptionPublisher Copyright: IEEE
dc.description.abstractIn this letter, we introduce a permittivity characterization method for thin materials. It can operate without reference-plane calibrations in free space, reducing system complexity, especially at THz frequencies. The relevant solving formulas and resolution analysis are derived. Full simulations validate the proposed method and analyze its performance with different thicknesses and loss tangents, showing excellent performance for common materials. When applying the method to characterize the permittivities of different samples in the G-band, it provides accurate estimates, particularly for high-loss materials. Therefore, it is a proper candidate for permittivity characterization of thin materials.en
dc.description.versionPeer revieweden
dc.format.extent5
dc.format.mimetypeapplication/pdfen_US
dc.identifier.citationXue, B 2024, 'Characterizing Complex Permittivity of Thin Materials by Free Space Transmission and Reflection Coefficients', IEEE Antennas and Wireless Propagation Letters, vol. 23, no. 12, pp. 4438-4442. https://doi.org/10.1109/LAWP.2024.3450634en
dc.identifier.doi10.1109/LAWP.2024.3450634en_US
dc.identifier.issn1536-1225
dc.identifier.issn1548-5757
dc.identifier.otherPURE UUID: 7b0e6a22-c80e-4bf4-8521-83bfa8f85ea9en_US
dc.identifier.otherPURE ITEMURL: https://research.aalto.fi/en/publications/7b0e6a22-c80e-4bf4-8521-83bfa8f85ea9en_US
dc.identifier.otherPURE FILEURL: https://research.aalto.fi/files/170123146/Characterizing_Complex_Permittivity_of_Thin_Materials_by_Free-Space_Transmission_and_Reflection_Coefficients.pdf
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/130855
dc.identifier.urnURN:NBN:fi:aalto-202409186403
dc.language.isoenen
dc.publisherIEEE
dc.relation.ispartofseriesIEEE Antennas and Wireless Propagation Lettersen
dc.relation.ispartofseriesVolume 23, issue 12, pp. 4438-4442en
dc.rightsopenAccessen
dc.subject.keywordAccuracyen_US
dc.subject.keywordAntenna measurementsen_US
dc.subject.keywordCalibrationen_US
dc.subject.keywordComplexity theoryen_US
dc.subject.keywordFree space methoden_US
dc.subject.keywordPermittivityen_US
dc.subject.keywordPermittivity measurementen_US
dc.subject.keywordReflection coefficienten_US
dc.subject.keywordTranscendental Equationen_US
dc.subject.keywordlow loss sheeten_US
dc.subject.keywordlow loss slabsen_US
dc.subject.keywordtransmission and reflection coefficientsen_US
dc.titleCharacterizing Complex Permittivity of Thin Materials by Free Space Transmission and Reflection Coefficientsen
dc.typeA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessäfi
dc.type.versionpublishedVersion

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