Characterizing Complex Permittivity of Thin Materials by Free Space Transmission and Reflection Coefficients
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Journal Title
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Volume Title
A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
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Author
Date
2024
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Mcode
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Language
en
Pages
5
Series
IEEE Antennas and Wireless Propagation Letters, pp. 1-5
Abstract
This letter introduces a permittivity characterization method for thin materials. It can operate without reference-plane calibrations in free space, reducing system complexity, especially at THz frequencies. The relevant solving formulas and resolution analysis are derived. Full simulations validate the proposed method and analyze its performance with different thicknesses and loss tangents, showing excellent performance for common materials. When applying the method to characterize the permittivities of different samples in the G-band, it provides accurate estimates, particularly for high-loss materials. Therefore, it is a proper candidate for permittivity characterization of thin materials.Description
Publisher Copyright: IEEE
Keywords
Accuracy, Antenna measurements, Calibration, Complexity theory, Free space method, low loss sheet, low loss slabs, Permittivity, Permittivity measurement, Reflection coefficient, Transcendental Equation, transmission and reflection coefficients
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Citation
Xue, B 2024, ' Characterizing Complex Permittivity of Thin Materials by Free Space Transmission and Reflection Coefficients ', IEEE Antennas and Wireless Propagation Letters, pp. 1-5 . https://doi.org/10.1109/LAWP.2024.3450634
