Radiation Damage in Double-Sided Silicon Strip Detectors
dc.contributor | Aalto-yliopisto | fi |
dc.contributor | Aalto University | en |
dc.contributor.author | Schulman, Tom | |
dc.contributor.department | Tietotekniikan osasto | fi |
dc.contributor.school | Teknillinen korkeakoulu | fi |
dc.contributor.school | Helsinki University of Technology | en |
dc.contributor.supervisor | Byckling, Eero | |
dc.date.accessioned | 2020-12-03T14:14:11Z | |
dc.date.available | 2020-12-03T14:14:11Z | |
dc.date.issued | 1991 | |
dc.format.extent | 77 | |
dc.identifier.uri | https://aaltodoc.aalto.fi/handle/123456789/80124 | |
dc.identifier.urn | URN:NBN:fi:aalto-2020120338962 | |
dc.language.iso | en | en |
dc.programme.major | Materiaalifysiikka | fi |
dc.programme.mcode | Tfy-44 | fi |
dc.rights.accesslevel | closedAccess | |
dc.title | Radiation Damage in Double-Sided Silicon Strip Detectors | en |
dc.title | Ionisoivan säteilyn aiheuttamat vauriot kaksipuolisissa piinauhasäteilynilmaisimissa | fi |
dc.type.okm | G2 Pro gradu, diplomityö | |
dc.type.ontasot | Master's thesis | en |
dc.type.ontasot | Pro gradu -tutkielma | fi |
dc.type.publication | masterThesis | |
local.aalto.digiauth | ask | |
local.aalto.digifolder | Aalto_43255 | |
local.aalto.idinssi | 6744 | |
local.aalto.openaccess | no |