Electron thermometry, refrigeration and heat transport in nanostructures at sub-kelvin temperatures
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Journal Title
Journal ISSN
Volume Title
School of Science |
Doctoral thesis (article-based)
| Defence date: 2017-05-12
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Author
Date
2017
Major/Subject
Mcode
Degree programme
Language
en
Pages
125 + app. 49
Series
Aalto University publication series DOCTORAL DISSERTATIONS, 80/2017
Description
Supervising professor
Pekola, Jukka P., Prof., Aalto University, Department of Applied Physics, FinlandThesis advisor
Pekola, Jukka P., Prof., Aalto University, Department of Applied Physics, FinlandKeywords
electron thermometry, refrigeration, tunnel junctions, heat
Other note
Parts
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[Publication 1]: A. V. Feshchenko , M. Meschke, D. Gunnarsson, M. Prunnila, L. Roschier, J. S. Penttila, J. P. Pekola. Primary Thermometry in the Intermediate Coulomb Blockade Regime. Journal of Low Temperature Physics, 173, 36 (9 pages), April 2013.
DOI: 10.1007/s10909-013-0874-x View at publisher
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[Publication 2]: A. V. Feshchenko, L. Casparis, I. M. Khaymovich, D. Maradan, O.-P. Saira, M. Palma, M. Meschke, J. P. Pekola, D. M. Zumbuhl. Tunnel-Junction Thermometry Down to Millikelvin Temperatures. Physical Review Applied, 4, 034001 (9 pages), September 2015.
DOI: 10.1103/PhysRevApplied.4.034001 View at publisher
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[Publication 3]: A. V. Feshchenko, J. V. Koski, J. P. Pekola. Experimental realization of a Coulomb blockade refrigerator. Physical Review B, 90, 201407(R) (5 pages), November 2014.
DOI: 10.1103/PhysRevB.90.201407 View at publisher
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[Publication 4]: A. V. Feshchenko, O.-P. Saira, J. T. Peltonen, J. P. Pekola. Thermal conductance of Nb thin films at sub-kelvin temperatures. Scientific Reports, 7, 41728 (13 pages), February 2017.
DOI: 10.1038/srep41728 View at publisher
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[Publication 5]: M. Koberidze, A. V. Feshchenko, M. J. Puska, R. M. Nieminen, J. P. Pekola. Effect of interface geometry on electron tunnelling in Al/Al2O3/Al junctions. Journal of Physics D: Applied Physics, 49, 165303 (8 pages), March 2016.
DOI: 10.1088/0022-3727/49/16/165303 View at publisher