Lock-in thermography approach for imaging the efficiency of light emitters and optical coolers

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© 2017 SPIE. One print or electronic copy may be made for personal use only. Systematic reproduction and distribution, duplication of any material in this paper for a fee or for commercial purposes, or modification of the content of the paper are prohibited.
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School of Science | A4 Artikkeli konferenssijulkaisussa

Date

2017

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Language

en

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7

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SPIE Proceedings, Volume 10121

Abstract

Developing optical cooling technologies requires access to reliable efficiency measurement techniques and ability to detect spatial variations in the efficiency and light emission of the devices. We investigate the possibility to combine the calorimetric efficiency measurement principles with lock-in thermography (LIT) and conventional luminescence microscopy to enable spatially resolved measurement of the efficiency, current spreading and local device heating of double diode structures (DDS) serving as test vessels for developing thermophotonic cooling devices. Our approach enables spatially resolved characterization and localization of the losses of the double diode structures as well as other light emitting semiconductor devices. In particular, the approach may allow directly observing effects like current crowding and surface recombination on the light emission and heating of the DDS devices.

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Keywords

lock-in thermography, calorimetry, efficiency

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Citation

Radevici, Ivan & Tiira, Jonna & Oksanen, Jani. 2017. Lock-in thermography approach for imaging the efficiency of light emitters and optical coolers. SPIE Proceedings. Volume 10121. 7. DOI: 10.1117/12.2249978.