Imaging the real shape of nanoclusters in scanning force microscopy
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© 2008 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Journal of Applied Physics, Volume 103, Issue 5 and may be found at http://scitation.aip.org/content/aip/journal/jap/103/5/10.1063/1.2841700.
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School of Science |
A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
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Date
2008
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Mcode
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Language
en
Pages
054313/1-7
Series
Journal of Applied Physics, Volume 103, Issue 5
Abstract
A quantitative comparison between experiment and theory is given for the constant height mode imaging of metal nanoclusters in dynamic scanning force microscopy. We explain the fundamental mechanisms in the contrast formation with the help of the system Pd/MgO(001). The comparison shows that the shape and size of nanoclusters are precisely imaged due to the sharpness of the tip’s last nanometer. This quantitative comparison proves our previously proposed model for the contrast formation.Description
Keywords
AFM, nanoclusters
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Citation
Pakarinen, Olli H. & Barth, Clemens & Foster, Adam S. & Henry, Claude R. 2008. Imaging the real shape of nanoclusters in scanning force microscopy. Journal of Applied Physics. Volume 103, Issue 5. 054313/1-7. ISSN 0021-8979 (printed). DOI: 10.1063/1.2841700