Characterization of the ESD properties of a BeCMOS technology
dc.contributor | Aalto-yliopisto | fi |
dc.contributor | Aalto University | en |
dc.contributor.advisor | Mellin, Jussi | |
dc.contributor.author | Pekkola, Jan | |
dc.contributor.department | Sähkö- ja tietoliikennetekniikan osasto | fi |
dc.contributor.school | Teknillinen korkeakoulu | fi |
dc.contributor.school | Helsinki University of Technology | en |
dc.contributor.supervisor | Kuivalainen, Pekka | |
dc.date.accessioned | 2020-12-04T14:13:23Z | |
dc.date.available | 2020-12-04T14:13:23Z | |
dc.date.issued | 2001 | |
dc.format.extent | xii + 77 | |
dc.format.mimetype | application/pdf | en |
dc.identifier.uri | https://aaltodoc.aalto.fi/handle/123456789/89355 | |
dc.identifier.urn | URN:NBN:fi:aalto-2020120448190 | |
dc.language.iso | en | en |
dc.programme.major | Elektronifysiikka | fi |
dc.programme.mcode | S-69 | fi |
dc.rights.accesslevel | openAccess | |
dc.subject.keyword | ESD characterization | en |
dc.subject.keyword | ESD-karakterisointi | fi |
dc.subject.keyword | CMOS | en |
dc.subject.keyword | parametrien määrittäminen | fi |
dc.subject.keyword | TLP | en |
dc.subject.keyword | testirakenne | fi |
dc.subject.keyword | parameter extraction | en |
dc.subject.keyword | test structure | en |
dc.title | Characterization of the ESD properties of a BeCMOS technology | en |
dc.title | Erään BeCMOS-teknologian ESD-ominaisuuksien karakterisointi | fi |
dc.type.okm | G2 Pro gradu, diplomityö | |
dc.type.ontasot | Master's thesis | en |
dc.type.ontasot | Pro gradu -tutkielma | fi |
dc.type.publication | masterThesis | |
local.aalto.digiauth | yes | |
local.aalto.digifolder | Aalto_35980 | |
local.aalto.idinssi | 18194 | |
local.aalto.openaccess | yes |
Files
Original bundle
1 - 1 of 1
No Thumbnail Available
- Name:
- master_Pekkola_Jan_2001.pdf
- Size:
- 29.66 MB
- Format:
- Adobe Portable Document Format