Characterization of the ESD properties of a BeCMOS technology
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Journal Title
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Volume Title
Helsinki University of Technology |
Diplomityö
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Authors
Date
2001
Department
Major/Subject
Elektronifysiikka
Mcode
S-69
Degree programme
Language
en
Pages
xii + 77
Series
Description
Supervisor
Kuivalainen, PekkaThesis advisor
Mellin, JussiKeywords
ESD characterization, ESD-karakterisointi, CMOS, parametrien määrittäminen, TLP, testirakenne, parameter extraction, test structure