Characterization of the ESD properties of a BeCMOS technology

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master_Pekkola_Jan_2001.pdf (29.66 MB)

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Volume Title

Helsinki University of Technology | Master's thesis
Location:
P1 Ark S80
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Authors

Date

2001

Department

Sähkö- ja tietoliikennetekniikan osasto

Major/Subject

Elektronifysiikka

Mcode

S-69

Degree programme

Language

en

Pages

xii + 77

Series

Description

Supervisor

Kuivalainen, Pekka

Thesis advisor

Mellin, Jussi

Keywords

ESD characterization, ESD-karakterisointi, CMOS, parametrien määrittäminen, TLP, testirakenne, parameter extraction, test structure

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https://urn.fi/URN:NBN:fi:aalto-2020120448190

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[dipl] Teknillinen korkeakoulu / TKK