Long hold times in a two-junction electron trap

Loading...
Thumbnail Image
Journal Title
Journal ISSN
Volume Title
School of Science | A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
Date
2011
Major/Subject
Mcode
Degree programme
Language
en
Pages
142106/1-3
Series
Applied Physics Letters, Volume 99, Issue 14
Abstract
The hold time τ of a single-electron trap is shown to increase significantly due to suppression of photon assisted tunneling events. Using two rf-tight radiation shields instead of a single one, we demonstrate increase of τ by a factor exceeding 103, up to about 10 h, for a trap with only two superconductor (S)—normal-metal (N) tunnel junctions and an on-chip resistorR ∼ 100 kΩ (R-SNS structure). In the normal state, the improved shielding made it possible to observe τ ∼ 100 s, which is in reasonable agreement with the quantum-leakage-limited level expected for the two-electron cotunneling process.
Description
Keywords
two-junction, single-electron trap, electrometers, tunneling, electroluminescence, photoacoustic imaging, resistors
Other note
Citation
Kemppinen, A. & Lotkhov, S. V. & Saira, O.-P. & Zorin, A. B. & Pekola, Jukka & Manninen, A. J. 2011. Long hold times in a two-junction electron trap. Applied Physics Letters. Volume 99, Issue 14. P. 142106/1-3. ISSN 0003-6951 (printed). DOI: 10.1063/1.3647557.