Long hold times in a two-junction electron trap
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© 2011 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters and may be found at http://scitation.aip.org/content/aip/journal/apl/99/14/10.1063/1.3647557
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School of Science |
A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
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Date
2011
Major/Subject
Mcode
Degree programme
Language
en
Pages
142106/1-3
Series
Applied Physics Letters, Volume 99, Issue 14
Abstract
The hold time τ of a single-electron trap is shown to increase significantly due to suppression of photon assisted tunneling events. Using two rf-tight radiation shields instead of a single one, we demonstrate increase of τ by a factor exceeding 103, up to about 10 h, for a trap with only two superconductor (S)—normal-metal (N) tunnel junctions and an on-chip resistorR ∼ 100 kΩ (R-SNS structure). In the normal state, the improved shielding made it possible to observe τ ∼ 100 s, which is in reasonable agreement with the quantum-leakage-limited level expected for the two-electron cotunneling process.Description
Keywords
two-junction, single-electron trap, electrometers, tunneling, electroluminescence, photoacoustic imaging, resistors
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Citation
Kemppinen, A. & Lotkhov, S. V. & Saira, O.-P. & Zorin, A. B. & Pekola, Jukka & Manninen, A. J. 2011. Long hold times in a two-junction electron trap. Applied Physics Letters. Volume 99, Issue 14. P. 142106/1-3. ISSN 0003-6951 (printed). DOI: 10.1063/1.3647557.