Improving the Utilization of Statistical Failure Models in Component Level Testing

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Journal ISSN
Volume Title
Sähkötekniikan korkeakoulu | Master's thesis
Ask about the availability of the thesis by sending email to the Aalto University Learning Centre oppimiskeskus@aalto.fi
Date
2016-06-13
Department
Major/Subject
Elektroniikka ja sovellukset
Mcode
S3007
Degree programme
EST - Elektroniikka ja sähkötekniikka (TS2005)
Language
en
Pages
72+9
Series
Description
Supervisor
Paulasto-Kröckel, Mervi
Thesis advisor
Kärkäs, Reijo
Keywords
PAT, MEMS, statistical screening, testing
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