Interface equations for capillary rise in random environment
dc.contributor | Aalto-yliopisto | fi |
dc.contributor | Aalto University | en |
dc.contributor.author | Laurila, T. | |
dc.contributor.author | Tong, C. | |
dc.contributor.author | Majaniemi, S. | |
dc.contributor.author | Ala-Nissilä, Tapio | |
dc.contributor.department | Teknillisen fysiikan laitos | fi |
dc.contributor.department | Department of Applied Physics | en |
dc.contributor.school | Perustieteiden korkeakoulu | fi |
dc.contributor.school | School of Science | en |
dc.date.accessioned | 2015-04-28T09:45:35Z | |
dc.date.available | 2015-04-28T09:45:35Z | |
dc.date.issued | 2006 | |
dc.description.abstract | We consider the influence of quenched noise upon interface dynamics in two-dimensional (2D) and 3D capillary rise with rough walls by using a phase-field approach, where the local conservation of mass in the bulk is explicitly included. In the 2D case, the disorder is assumed to be in the effective mobility coefficient, while in the 3D case we explicitly consider the influence of locally fluctuating geometry along a solid wall using a generalized curvilinear coordinate transformation. To obtain the equations of motion for meniscus andcontact lines, we develop a systematic projection formalism that allows inclusion of disorder. Using this formalism, we derive linearized equations of motion for the meniscus and contact line variables, which become local in the Fourier space representation. These dispersion relations contain effective noise that is linearly proportional to the velocity. The deterministic parts of our dispersion relations agree with results obtained from other similar studies in the proper limits. However, the forms of the noise terms derived here are quantitatively different from the other studies. | en |
dc.description.version | Peer reviewed | en |
dc.format.extent | 041601/1-11 | |
dc.format.mimetype | application/pdf | en |
dc.identifier.citation | Laurila, T. & Tong, C. & Majaniemi, S. & Ala-Nissilä, Tapio. 2006. Interface equations for capillary rise in random environment. Physical Review E. Volume 74, Issue 4. P. 041601/1-11. ISSN 1539-3755 (printed). DOI: 10.1103/physreve.74.041601. | en |
dc.identifier.doi | 10.1103/physreve.74.041601 | |
dc.identifier.issn | 1539-3755 (printed) | |
dc.identifier.uri | https://aaltodoc.aalto.fi/handle/123456789/15814 | |
dc.identifier.urn | URN:NBN:fi:aalto-201504282475 | |
dc.language.iso | en | en |
dc.publisher | American Physical Society (APS) | en |
dc.relation.ispartofseries | Physical Review E | en |
dc.relation.ispartofseries | Volume 74, Issue 4 | |
dc.rights | © 2006 American Physical Society (APS). http://www.aps.org | en |
dc.rights.holder | American Physical Society (APS) | |
dc.subject.keyword | random media | en |
dc.subject.keyword | interface dynamics | en |
dc.subject.keyword | fluctuation phenomena | en |
dc.subject.other | Physics | en |
dc.title | Interface equations for capillary rise in random environment | en |
dc.type | A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä | fi |
dc.type.dcmitype | text | en |
dc.type.version | Final published version | en |
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