General V(λ) mismatch index: History, current state and new ideas

Loading...
Thumbnail Image
Access rights
openAccess
Journal Title
Journal ISSN
Volume Title
A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
Date
2023-06-01
Major/Subject
Mcode
Degree programme
Language
en
Pages
13
Series
Lighting Research and Technology
Abstract
The general V(λ) mismatch index f1′ specifies the mismatch between the relative spectral responsivity of a photometer, and the spectral luminous efficiency function for photopic vision, V(λ). A short review of its historical development explains the reasons for the current definition and which adjustments may be helpful in the future. The properties of the current definition are described in detail. It is very likely that photometers will be calibrated with a white light-emitting diode (LED) light source as the reference in the future. This might involve the need for a more appropriate definition of the general V(λ) mismatch index, either by using a different normalisation in f1′ for the relative spectral responsivity of the photometer or by introducing a different type of function for assessing the mismatch. On the other hand, the measurement of coloured LEDs is also becoming increasingly important. So, is a single general mismatch index for white and coloured light sources sufficient?
Description
Funding Information: The authors disclosed receipt of the following financial support for the research, authorship, and/or publication of this article: This project, 19NRM02 RevStdLED, has received funding from the EMPIR programme co-financed by the participating counties and from the European Union’s Horizon 2020 research and innovation programme. VM acknowledges partial support by the Academy of Finland Flagship Programme, Photonics Research and Innovation (PREIN), decision number: 320167.
Keywords
Other note
Citation
Krüger , U , Ferrero , A , Thorseth , A , Mantela , V & Sperling , A 2023 , ' General V(λ) mismatch index: History, current state and new ideas ' , Lighting Research and Technology , vol. 55 , no. 4-5 , pp. 420-432 . https://doi.org/10.1177/14771535231158528