Convergence of supercell calculations for point defects in semiconductors: Vacancy in silicon

dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorPuska, Martti J.
dc.contributor.authorPöykkö, S.
dc.contributor.authorPesola, M.
dc.contributor.authorNieminen, Risto M.
dc.contributor.departmentDepartment of Applied Physicsen
dc.contributor.departmentTeknillisen fysiikan laitosfi
dc.contributor.schoolPerustieteiden korkeakoulufi
dc.contributor.schoolSchool of Scienceen
dc.date.accessioned2015-08-12T09:02:02Z
dc.date.available2015-08-12T09:02:02Z
dc.date.issued1998
dc.description.abstractThe convergence of first-principles supercell calculations for defects in semiconductors is studied with the vacancy in bulk Si as a test case. The ionic relaxations, defect formation energies, and ionization levels are calculated for supercell sizes of up to 216 atomic sites using several k-point meshes in the Brillouin-zone integrations. The energy dispersion, inherent for the deep defect states in the supercell approximation, and the long range of the ionic relaxations are shown to postpone the convergence so that conclusive results for the physical properties cannot be obtained before the supercell size is of the order of 128–216 atomic sites.en
dc.description.versionPeer revieweden
dc.format.extent1318-1325
dc.format.mimetypeapplication/pdfen
dc.identifier.citationPuska, M. J. & Pöykkö, S. & Pesola, M. & Nieminen, Risto M. 1998. Convergence of supercell calculations for point defects in semiconductors: Vacancy in silicon. Physical Review B. Volume 58, Issue 3. 1318-1325. ISSN 1550-235X (electronic). DOI: 10.1103/physrevb.58.1318.en
dc.identifier.doi10.1103/physrevb.58.1318
dc.identifier.issn1550-235X (electronic)
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/17393
dc.identifier.urnURN:NBN:fi:aalto-201508124005
dc.language.isoenen
dc.publisherAmerican Physical Society (APS)en
dc.relation.ispartofseriesPhysical Review Ben
dc.relation.ispartofseriesVolume 58, Issue 3
dc.rights© 1998 American Physical Society (APS). This is the accepted version of the following article: Puska, M. J. & Pöykkö, S. & Pesola, M. & Nieminen, Risto M. 1998. Convergence of supercell calculations for point defects in semiconductors: Vacancy in silicon. Physical Review B. Volume 58, Issue 3. 1318-1325. ISSN 1550-235X (electronic). DOI: 10.1103/physrevb.58.1318, which has been published in final form at http://journals.aps.org/prb/abstract/10.1103/PhysRevB.58.1318.en
dc.rights.holderAmerican Physical Society (APS)
dc.subject.keywordsemiconductorsen
dc.subject.keyworddefectsen
dc.subject.keywordionic relaxationsen
dc.subject.otherPhysicsen
dc.titleConvergence of supercell calculations for point defects in semiconductors: Vacancy in siliconen
dc.typeA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessäfi
dc.type.dcmitypetexten
dc.type.versionFinal published versionen

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