Electronic cooling of a submicron-sized metallic beam

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© 2009 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Applied Physics Letters and may be found at http://scitation.aip.org/content/aip/journal/apl/94/7/10.1063/1.3080668

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Journal Title

Journal ISSN

Volume Title

School of Science | A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä

Date

2009

Major/Subject

Mcode

Degree programme

Language

en

Pages

073101/1-3

Series

Applied Physics Letters, Volume 94, Issue 7

Abstract

We demonstrate electronic cooling of a suspended AuPd island using superconductor-insulator-normal metaltunnel junctions. This was achieved by developing a simple fabrication method for reliably releasing narrow submicron-sized metal beams. The process is based on reactive ion etching and uses a conducting substrate to avoid charge-up damage and is compatible with, e.g., conventional e-beam lithography, shadow-angle metal deposition, and oxide tunnel junctions. The devices function well and exhibit clear cooling, up to a factor of 2 at sub-Kelvin temperatures.

Description

Keywords

phonons, superconducting metals, tunnel junctions, etching, microelectromechanical systems

Other note

Citation

Muhonen, J. T. & Niskanen, A. O. & Meschke, M. & Pashkin, Yu. A. & Tsai, J. S. & Sainiemi, L. & Franssila, S. & Pekola, Jukka. 2009. Electronic cooling of a submicron-sized metallic beam. Applied Physics Letters. Volume 94, Issue 7. P. 073101/1-3. ISSN 0003-6951 (printed). DOI: 10.1063/1.3080668.