Ionising Radiation Effects in MOS Devices
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Helsinki University of Technology |
Licentiate thesis
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Instructions for the author
Authors
Date
1995
Department
Major/Subject
Optoelektroniikka
Mcode
S-104
Degree programme
Language
en
Pages
72
Series
Description
Supervisor
Tuomi, TurkkaThesis advisor
Palmén, HelgeKeywords
radiation effects, MOS, MINIMOS, APLAC, irradiation test