Scanning Tunneling Microscopy Characterization of the CaF2/Si(001) Interface
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Informaatio- ja luonnontieteiden tiedekunta |
Bachelor's thesis
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Authors
Date
2010
Department
Major/Subject
Teknillinen fysiikka
Mcode
F3005
Degree programme
Teknillisen fysiikan ja matematiikan tutkinto-ohjelma (TFM)
Language
en
Pages
22 s.
Series
Description
Supervisor
Nieminen, RistoThesis advisor
Pinto, HenryKeywords
computational physics, silicon, calcium difluoride, scanning tunneling microscopy, electronic structure, density functional theory