Defect Agglomeration and Electron-Beam-Induced Local-Phase Transformations in Single-Layer MoTe2
No Thumbnail Available
Access rights
openAccess
URL
Journal Title
Journal ISSN
Volume Title
A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
This publication is imported from Aalto University research portal.
View publication in the Research portal (opens in new window)
Other link related to publication (opens in new window)
View publication in the Research portal (opens in new window)
Other link related to publication (opens in new window)
Date
2021-06-24
Major/Subject
Mcode
Degree programme
Language
en
Pages
9
13601-13609
13601-13609
Series
Journal of Physical Chemistry C, Volume 125, issue 24
Abstract
Atom migrations in single-layer 1H-MoTe2 are studied with Cc/Cs-corrected high-resolution transmission electron microscopy at an electron energy of 40 keV using the electron beam simultaneously for material modification and imaging. After creating tellurium vacancies and vacancy lines, we observe their migration pathways across the lattice. Furthermore, we analyze phase transformations from the 1H- to the 1T′-phase associated with the strain induced due to the formation of Te vacancy lines. Combining the experimental data with the results of first-principles calculations, we explain the energetics and driving forces of point- and line-defect migrations and the phase transformations due to an interplay of electron-beam-induced energy input, atom ejection, and strain spread. Our results enhance the understanding of defect dynamics in 2D transition metal dichalcogenides, which should facilitate tailoring their local optical and electronic properties.Description
Funding Information: We acknowledge funding from the German Research Foundation (DFG), project KR 48661/1, and through the collaborative research center “Chemistry of Synthetic 2D Materials” SFB-1415-417590517. We acknowledge the German Research Foundation (DFG) and the Ministry of Science, Research and the Arts (MWK) of the federal state of Baden-Württemberg, Germany, in the frame of the SALVE (sub-Angström low-voltage electron microscopy) project (KA1295/21-1). We further thank HLRS, Stuttgart, Germany, and TU Dresden (Taurus cluster) for the generous grant of CPU time. Publisher Copyright: ©
Keywords
Other note
Citation
Köster , J , Ghorbani-Asl , M , Komsa , H P , Lehnert , T , Kretschmer , S , Krasheninnikov , A V & Kaiser , U 2021 , ' Defect Agglomeration and Electron-Beam-Induced Local-Phase Transformations in Single-Layer MoTe 2 ' , Journal of Physical Chemistry C , vol. 125 , no. 24 , pp. 13601-13609 . https://doi.org/10.1021/acs.jpcc.1c02202