Interferometric imaging of reflective micro-objects in the presence of strong aberrations
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A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
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Date
2020-01-20
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en
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10
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Optics Express, Volume 28, issue 2, pp. 1817-1826
Abstract
Some imaging techniques reduce the effect of optical aberrations either by detecting and actively compensating for them or by utilizing interferometry. A microscope based on a Mach-Zehnder interferometer has been recently introduced to allow obtaining sharp images of light-transmitting objects in the presence of strong aberrations. However, the method is not capable of imaging microstructures on opaque substrates. In this work, we use a Michelson interferometer to demonstrate imaging of reflecting and back-scattering objects on any substrate with micrometer-scale resolution. The system is remarkably insensitive to both deterministic and random aberrations that can completely destroy the object’s intensity image.Description
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Ilina, E, Nyman, M, Mondal, T, Kaivola, M, Setälä, T & Shevchenko, A 2020, ' Interferometric imaging of reflective micro-objects in the presence of strong aberrations ', Optics Express, vol. 28, no. 2, pp. 1817-1826 . https://doi.org/10.1364/OE.383451