Electron counting in a silicon single-electron pump
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A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
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Date
2015-10-16
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Language
en
Pages
6
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New Journal of Physics, Volume 17, issue 10
Abstract
We report electron counting experiments in a silicon metal-oxide-semiconductor quantum dot architecture which has been previously demonstrated to generate a quantized current in excess of 80 pA with uncertainty below 30 parts per million. Single-shot detection of electrons pumped into a reservoir dot is performed using a capacitively coupled single-electron transistor. We extract the full probability distribution of the transfer of n electrons per pumping cycle for We find that the probabilities extracted from the counting experiment are in agreement with direct current measurements in a broad range of dc electrochemical potentials of the pump. The electron counting technique is also used to confirm the improving robustness of the pumping mechanism with increasing electrostatic confinement of the quantum dot.Description
Keywords
charge pumping, electron counting, quantum dots, single-electron pump
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Citation
Tanttu, T, Rossi, A, Tan, K Y, Huhtinen, K-E, Chan, K W, Möttönen, M & Dzurak, A S 2015, ' Electron counting in a silicon single-electron pump ', New Journal of Physics, vol. 17, no. 10, 103030 . https://doi.org/10.1088/1367-2630/17/10/103030