An Automated EM-Simulation Environment with Parameterized Layout Generation for Microwave Integrated Circuits
| dc.contributor | Aalto-yliopisto | fi |
| dc.contributor | Aalto University | en |
| dc.contributor.author | Ryynanen, Kaisa | en_US |
| dc.contributor.author | Lahtinen, Veeti | en_US |
| dc.contributor.author | Porrasmaa, Santeri | en_US |
| dc.contributor.author | Stadius, Kari | en_US |
| dc.contributor.author | Kosunen, Marko | en_US |
| dc.contributor.author | Ryynanen, Jussi | en_US |
| dc.contributor.department | Department of Electronics and Nanoengineering | en |
| dc.contributor.editor | Nurmi, Jari | en_US |
| dc.contributor.editor | Ellervee, Peeter | en_US |
| dc.contributor.editor | Koch, Peter | en_US |
| dc.contributor.editor | Moradi, Farshad | en_US |
| dc.contributor.editor | Shen, Ming | en_US |
| dc.contributor.groupauthor | Jussi Ryynänen Group | en |
| dc.contributor.organization | Jussi Ryynänen Group | en_US |
| dc.date.accessioned | 2024-01-31T08:25:19Z | |
| dc.date.available | 2024-01-31T08:25:19Z | |
| dc.date.issued | 2023 | en_US |
| dc.description | Publisher Copyright: © 2023 IEEE. | |
| dc.description.abstract | Design automation of microwave components is increasing its importance in sub-THz applications such as fifth (5G) and sixth generation (6G) communications and sensing applications. Sub-THz design involves laborious, tedious and time-consuming iterative trial-and-error work present in typical electromagnetic design flows used for microwave circuits. To eliminate the need for manual iterations, this paper introduces an automated design environment, which enables seamless integration of these components to traditional tool-chains in integrated circuits. The implementation uses Berkeley Analog Generator (BAG) for programmatic layout generation, ADS Momentum applied as an electromagnetic (EM) field simulator, and The System Development Kit (TheSyDeKick) multi-simulator system design and verification environment. In this work, a new open-source ADS Momentum TheSyDeKick simulation interface has been implemented to bind the two former together which enables large-scale optimization of microwave components. The advantage of using the design environment is demonstrated by generating and simulating 260 interwound and 104 stacked transformers in a loop to find the optimum for 100 GHz. | en |
| dc.description.version | Peer reviewed | en |
| dc.format.extent | 6 | |
| dc.format.mimetype | application/pdf | en_US |
| dc.identifier.citation | Ryynanen, K, Lahtinen, V, Porrasmaa, S, Stadius, K, Kosunen, M & Ryynanen, J 2023, An Automated EM-Simulation Environment with Parameterized Layout Generation for Microwave Integrated Circuits. in J Nurmi, P Ellervee, P Koch, F Moradi & M Shen (eds), 2023 IEEE Nordic Circuits and Systems Conference, NorCAS 2023 - Proceedings. IEEE, IEEE Nordic Circuits and Systems Conference, Aalborg, Denmark, 31/10/2023. https://doi.org/10.1109/NorCAS58970.2023.10305468 | en |
| dc.identifier.doi | 10.1109/NorCAS58970.2023.10305468 | en_US |
| dc.identifier.isbn | 979-8-3503-3757-0 | |
| dc.identifier.other | PURE UUID: e01b9fc2-b7e2-4585-841d-be5d82d50dbe | en_US |
| dc.identifier.other | PURE ITEMURL: https://research.aalto.fi/en/publications/e01b9fc2-b7e2-4585-841d-be5d82d50dbe | en_US |
| dc.identifier.other | PURE FILEURL: https://research.aalto.fi/files/135110136/NORCAS2023_BAG_SyDeKick_EMsim.pdf | |
| dc.identifier.uri | https://aaltodoc.aalto.fi/handle/123456789/126600 | |
| dc.identifier.urn | URN:NBN:fi:aalto-202401312267 | |
| dc.language.iso | en | en |
| dc.relation.ispartof | IEEE Nordic Circuits and Systems Conference | en |
| dc.relation.ispartofseries | 2023 IEEE Nordic Circuits and Systems Conference, NorCAS 2023 - Proceedings | en |
| dc.rights | openAccess | en |
| dc.subject.keyword | design automation | en_US |
| dc.subject.keyword | electromagnetic simulation | en_US |
| dc.subject.keyword | integrated circuits | en_US |
| dc.subject.keyword | microwave | en_US |
| dc.title | An Automated EM-Simulation Environment with Parameterized Layout Generation for Microwave Integrated Circuits | en |
| dc.type | A4 Artikkeli konferenssijulkaisussa | fi |
| dc.type.version | acceptedVersion |