Effect of anode sheet resistance on rise time of black silicon induced junction photodiodes

Loading...
Thumbnail Image
Access rights
openAccess
Journal Title
Journal ISSN
Volume Title
A4 Artikkeli konferenssijulkaisussa
This publication is imported from Aalto University research portal.
View publication in the Research portal
View/Open full text file from the Research portal
Date
2022-03-04
Major/Subject
Mcode
Degree programme
Language
en
Pages
Series
SPIE Conference Proceedings, Volume 11997
Abstract
Black silicon induced junction photodiodes have been shown to have nearly ideal responsivity across a wide range of wavelengths. Another important characteristic of a high-quality photodiode is rise time which can be used to approximate bandwidth of the photodiode. We show experimentally that the rise time of black silicon photodiodes is shorter than in planar photodiodes when alumina layer with similar charge is used to make an induced junction in both. Additionally, we show that the rise time can be rather well approximated using an analytical equation, which combines Elmore delay from equivalent circuit with standard RC-delay arising from series and load resistances.
Description
Keywords
black silicon, rise time, sheet resistance, silicon, photodiode
Other note
Citation
Heinonen, J, Haarahiltunen, A, Vähänissi, V, Pasanen, T P, Savin, H & Juntunen, M A 2022, Effect of anode sheet resistance on rise time of black silicon induced junction photodiodes . in Optical Components and Materials XIX . vol. 11997, SPIE Conference Proceedings, SPIE, Optical Components and Materials, San Francisco, California, United States, 22/01/2022 . https://doi.org/10.1117/12.2609632