Calculated properties of point defects in Be-doped GaN

dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorLatham, Christopher D.
dc.contributor.authorNieminen, Risto M.
dc.contributor.authorFall, C.D.
dc.contributor.authorJones, R.
dc.contributor.authorÖberg, S.
dc.contributor.authorBriddon, P.R.
dc.contributor.departmentDepartment of Applied Physicsen
dc.contributor.groupauthorElectronic Properties of Materialsen
dc.date.accessioned2025-10-08T06:48:05Z
dc.date.available2025-10-08T06:48:05Z
dc.date.issued2003
dc.description.abstractThe properties of several point defects in hexagonal gallium nitride that can compensate beryllium shallow acceptors (BeGa) are calculated using the AIMPRO method based on local density functional theory. BeGa itself is predicted to have local vibrational modes (LVM’s) very similar to magnesium acceptors. The highest frequency is about 663cm−1. Consistent with other recent studies, we find that interstitial beryllium double donors and single-donor beryllium split interstitial pairs at gallium sites are very likely causes of compensation. The calculations predict that the split interstitial pairs possess three main LVM’s at about 1041, 789, and 738cm−1. Of these, the highest is very close to the experimental observation in Be-doped GaN. Although an oxygen donor at the nearest-neighboring site to a beryllium acceptor (BeGa−ON) is also a prime suspect among defects that are possibly responsible for compensation, its highest frequency is calculated to be about 699cm−1 and hence is not related in any way to the observed center. Another mode for this defect is estimated to be about 523cm−1 and is localized on the ON atom. These two vibrations of BeGa−ON are thus equivalent to those for the isolated substitutional centers perturbed by the presence of their impurity partners.en
dc.description.versionPeer revieweden
dc.format.mimetypeapplication/pdf
dc.identifier.citationLatham, C D, Nieminen, R M, Fall, C D, Jones, R, Öberg, S & Briddon, P R 2003, 'Calculated properties of point defects in Be-doped GaN', Physical Review B, vol. 67, no. 20, 205206, pp. 1-8. https://doi.org/10.1103/PhysRevB.67.205206en
dc.identifier.doi10.1103/PhysRevB.67.205206
dc.identifier.issn2469-9969
dc.identifier.otherPURE UUID: 5e24a347-e1be-461a-8718-b57ef95418f8
dc.identifier.otherPURE ITEMURL: https://research.aalto.fi/en/publications/5e24a347-e1be-461a-8718-b57ef95418f8
dc.identifier.otherPURE FILEURL: https://research.aalto.fi/files/14664801/PhysRevB.67.205206.pdf
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/139562
dc.identifier.urnURN:NBN:fi:aalto-202510087743
dc.language.isoenen
dc.publisherAmerican Physical Society
dc.relation.ispartofseriesPhysical Review Ben
dc.relation.ispartofseriesVolume 67, issue 20, pp. 1-8en
dc.rightsopenAccessen
dc.titleCalculated properties of point defects in Be-doped GaNen
dc.typeA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessäfi
dc.type.versionpublishedVersion

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