Characterization of thin film adhesion by MEMS shaft-loading blister testing
| dc.contributor | Aalto-yliopisto | fi |
| dc.contributor | Aalto University | en |
| dc.contributor.author | Berdova, Maria | en_US |
| dc.contributor.author | Lyytinen, Jussi | en_US |
| dc.contributor.author | Grigoras, Kestuti | en_US |
| dc.contributor.author | Baby, Anu | en_US |
| dc.contributor.author | Kilpi, Lauri | en_US |
| dc.contributor.author | Ronkainen, Helena | en_US |
| dc.contributor.author | Franssila, Sami | en_US |
| dc.contributor.author | Koskinen, Jari | en_US |
| dc.contributor.department | Department of Materials Science and Engineering | en |
| dc.contributor.department | Aalto Nanofab | en |
| dc.contributor.department | Department of Chemistry and Materials Science | en |
| dc.date.accessioned | 2016-09-16T07:34:44Z | |
| dc.date.issued | 2013 | en_US |
| dc.description.version | Peer reviewed | en |
| dc.format.extent | 5 | |
| dc.format.mimetype | application/pdf | en_US |
| dc.identifier.citation | Berdova, M, Lyytinen, J, Grigoras, K, Baby, A, Kilpi, L, Ronkainen, H, Franssila, S & Koskinen, J 2013, 'Characterization of thin film adhesion by MEMS shaft-loading blister testing', Journal of Vacuum Science and Technology A, vol. 31, no. 3, 031102, pp. 1-5. https://doi.org/10.1116/1.4801921 | en |
| dc.identifier.doi | 10.1116/1.4801921 | en_US |
| dc.identifier.issn | 0734-2101 | |
| dc.identifier.issn | 1520-8559 | |
| dc.identifier.other | PURE UUID: eb86f156-1316-487f-9ace-4adc7f492334 | en_US |
| dc.identifier.other | PURE ITEMURL: https://research.aalto.fi/en/publications/eb86f156-1316-487f-9ace-4adc7f492334 | en_US |
| dc.identifier.other | PURE LINK: http://dx.doi.org/10.1116/1.4801921 | en_US |
| dc.identifier.other | PURE FILEURL: https://research.aalto.fi/files/6323993/Berdova_lyytinen_et_al_10_1116_1_4801921.pdf | en_US |
| dc.identifier.uri | https://aaltodoc.aalto.fi/handle/123456789/21944 | |
| dc.identifier.urn | URN:NBN:fi:aalto-201609163825 | |
| dc.language.iso | en | en |
| dc.publisher | AVS Science and Technology Society | |
| dc.relation.ispartofseries | Journal of Vacuum Science and Technology A | en |
| dc.relation.ispartofseries | Volume 31, issue 3, pp. 1-5 | en |
| dc.rights | openAccess | en |
| dc.subject.keyword | adhesion | en_US |
| dc.subject.keyword | atomic layer deposition | en_US |
| dc.subject.keyword | shaft-loading blister test | en_US |
| dc.subject.keyword | thin films | en_US |
| dc.title | Characterization of thin film adhesion by MEMS shaft-loading blister testing | en |
| dc.type | A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä | fi |
| dc.type.version | publishedVersion |