Chemical Identification of Ions in Doped NaCl by Scanning Force Microscopy

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dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorFoster, Adam S.
dc.contributor.authorBarth, Clemens
dc.contributor.authorHenry, Claude R.
dc.contributor.departmentTeknillisen fysiikan laitosfi
dc.contributor.departmentDepartment of Applied Physicsen
dc.contributor.schoolPerustieteiden korkeakoulufi
dc.contributor.schoolSchool of Scienceen
dc.date.accessioned2015-06-17T09:01:08Z
dc.date.available2015-06-17T09:01:08Z
dc.date.issued2009
dc.description.abstractA quantitative comparison between experiment and theory is presented, which shows that all ions of the Suzuki structure on (001) surfaces of Mg2+ or Cd2+ doped NaCl crystals can be identified despite the tip-surface distance, differences in impurity chemistry, and surface termination. The identification can be used to calibrate the potential of the tip's last atom, and it is proposed to use these surfaces for better characterization of deposited nano-objects.en
dc.description.versionPeer revieweden
dc.format.extent256103/1-4
dc.format.mimetypeapplication/pdfen
dc.identifier.citationFoster, Adam S. & Barth, Clemens & Henry, Claude R.. 2009. Chemical Identification of Ions in Doped NaCl by Scanning Force Microscopy. Physical Review Letters. Volume 102, Issue 25. 256103/1-4. ISSN 0031-9007 (printed). DOI: 10.1103/physrevlett.102.256103.en
dc.identifier.doi10.1103/physrevlett.102.256103
dc.identifier.issn0031-9007 (printed)
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/16549
dc.identifier.urnURN:NBN:fi:aalto-201506173195
dc.language.isoenen
dc.publisherAmerican Physical Society (APS)en
dc.relation.ispartofseriesPhysical Review Lettersen
dc.relation.ispartofseriesVolume 102, Issue 25
dc.rights© 2009 American Physical Society (APS). This is the accepted version of the following article: Foster, Adam S. & Barth, Clemens & Henry, Claude R.. 2009. Chemical Identification of Ions in Doped NaCl by Scanning Force Microscopy. Physical Review Letters. Volume 102, Issue 25. 256103/1-4. ISSN 0031-9007 (printed). DOI: 10.1103/physrevlett.102.256103, which has been published in final form at http://journals.aps.org/prl/abstract/10.1103/PhysRevLett.102.256103.en
dc.rights.holderAmerican Physical Society (APS)
dc.subject.keywordAFMen
dc.subject.keywordionsen
dc.subject.keywordSuzuki structuresen
dc.subject.keyword(001) surfacesen
dc.subject.otherPhysicsen
dc.titleChemical Identification of Ions in Doped NaCl by Scanning Force Microscopyen
dc.typeA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessäfi
dc.type.dcmitypetexten
dc.type.versionFinal published versionen

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