Chemical Identification of Ions in Doped NaCl by Scanning Force Microscopy

Loading...
Thumbnail Image
Journal Title
Journal ISSN
Volume Title
School of Science | A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
Date
2009
Major/Subject
Mcode
Degree programme
Language
en
Pages
256103/1-4
Series
Physical Review Letters, Volume 102, Issue 25
Abstract
A quantitative comparison between experiment and theory is presented, which shows that all ions of the Suzuki structure on (001) surfaces of Mg2+ or Cd2+ doped NaCl crystals can be identified despite the tip-surface distance, differences in impurity chemistry, and surface termination. The identification can be used to calibrate the potential of the tip's last atom, and it is proposed to use these surfaces for better characterization of deposited nano-objects.
Description
Keywords
AFM, ions, Suzuki structures, (001) surfaces
Other note
Citation
Foster, Adam S. & Barth, Clemens & Henry, Claude R.. 2009. Chemical Identification of Ions in Doped NaCl by Scanning Force Microscopy. Physical Review Letters. Volume 102, Issue 25. 256103/1-4. ISSN 0031-9007 (printed). DOI: 10.1103/physrevlett.102.256103.