Chemical Identification of Ions in Doped NaCl by Scanning Force Microscopy
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© 2009 American Physical Society (APS). This is the accepted version of the following article: Foster, Adam S. & Barth, Clemens & Henry, Claude R.. 2009. Chemical Identification of Ions in Doped NaCl by Scanning Force Microscopy. Physical Review Letters. Volume 102, Issue 25. 256103/1-4. ISSN 0031-9007 (printed). DOI: 10.1103/physrevlett.102.256103, which has been published in final form at http://journals.aps.org/prl/abstract/10.1103/PhysRevLett.102.256103.
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A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
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en
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256103/1-4
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Physical Review Letters, Volume 102, Issue 25
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A quantitative comparison between experiment and theory is presented, which shows that all ions of the Suzuki structure on (001) surfaces of Mg2+ or Cd2+ doped NaCl crystals can be identified despite the tip-surface distance, differences in impurity chemistry, and surface termination. The identification can be used to calibrate the potential of the tip's last atom, and it is proposed to use these surfaces for better characterization of deposited nano-objects.Description
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Foster, Adam S. & Barth, Clemens & Henry, Claude R.. 2009. Chemical Identification of Ions in Doped NaCl by Scanning Force Microscopy. Physical Review Letters. Volume 102, Issue 25. 256103/1-4. ISSN 0031-9007 (printed). DOI: 10.1103/physrevlett.102.256103.