Accelerated light-induced degradation for detecting copper contamination in p-type silicon
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A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
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Applied Physics Letters, Volume 107, issue 5
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VK: T40310
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Inglese, A, Lindroos, J & Savin, H 2015, 'Accelerated light-induced degradation for detecting copper contamination in p-type silicon', Applied Physics Letters, vol. 107, no. 5. https://doi.org/10.1063/1.4927838