Optimizing electrode positions in electrical impedance tomography

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dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorHyvönen, Nuuttien_US
dc.contributor.authorSeppänen, Akuen_US
dc.contributor.authorStaboulis, Stratosen_US
dc.contributor.departmentDepartment of Mathematics and Systems Analysisen
dc.contributor.groupauthorNumerical Analysisen
dc.date.accessioned2019-02-25T08:56:35Z
dc.date.available2019-02-25T08:56:35Z
dc.date.issued2014en_US
dc.description.versionPeer revieweden
dc.format.extent1831-1851
dc.format.mimetypeapplication/pdfen_US
dc.identifier.citationHyvönen, N, Seppänen, A & Staboulis, S 2014, ' Optimizing electrode positions in electrical impedance tomography ', SIAM Journal on Applied Mathematics, vol. 74, no. 6, pp. 1831-1851 . https://doi.org/10.1137/140966174en
dc.identifier.doi10.1137/140966174en_US
dc.identifier.issn0036-1399
dc.identifier.issn1095-712X
dc.identifier.otherPURE UUID: fc61c961-3915-455b-b33c-8244136453a3en_US
dc.identifier.otherPURE ITEMURL: https://research.aalto.fi/en/publications/fc61c961-3915-455b-b33c-8244136453a3en_US
dc.identifier.otherPURE LINK: http://epubs.siam.org/loi/smjmapen_US
dc.identifier.otherPURE FILEURL: https://research.aalto.fi/files/32111195/140966174.pdfen_US
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/36954
dc.identifier.urnURN:NBN:fi:aalto-201902252111
dc.language.isoenen
dc.publisherSociety for Industrial and Applied Mathematics Publications
dc.relation.ispartofseriesSIAM JOURNAL ON APPLIED MATHEMATICSen
dc.relation.ispartofseriesVolume 74, issue 6en
dc.rightsopenAccessen
dc.titleOptimizing electrode positions in electrical impedance tomographyen
dc.typeA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessäfi
dc.type.versionpublishedVersion
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