Temperature dependence of carrier relaxation in strain-induced quantum dots
dc.contributor | Aalto-yliopisto | fi |
dc.contributor | Aalto University | en |
dc.contributor.author | Braskén, M. | |
dc.contributor.author | Lindberg, M. | |
dc.contributor.author | Sopanen, Markku | |
dc.contributor.author | Lipsanen, Harri | |
dc.contributor.author | Tulkki, J. | |
dc.contributor.department | Department of Micro and Nanosciences | en |
dc.contributor.department | Mikro- ja nanotekniikan laitos | fi |
dc.contributor.school | Sähkötekniikan korkeakoulu | fi |
dc.contributor.school | School of Electrical Engineering | en |
dc.date.accessioned | 2015-05-15T09:01:04Z | |
dc.date.available | 2015-05-15T09:01:04Z | |
dc.date.issued | 1998 | |
dc.description.abstract | We report experimental observation and theoretical interpretation of temperature-dependent, time-resolved luminescence from strain-induced quantum dots. The experimental results are well described by a master equation model for the electrons. The intraband relaxation in the conduction band and the radiative recombination rate are governed by the hole populations resulting in prominent temperature dependence of the relaxation process. Even when only a few electrons and holes are confined in a single quantum dot the Auger-like process provides a rapid intraband relaxation channel for electrons that can replace the phonon scattering as the dominant relaxation mechanism. | en |
dc.description.version | Peer reviewed | en |
dc.format.extent | R15993-R15996 | |
dc.format.mimetype | application/pdf | en |
dc.identifier.citation | Braskén, M. & Lindberg, M. & Sopanen, M. & Lipsanen, Harri & Tulkki, J.. 1998. Temperature dependence of carrier relaxation in strain-induced quantum dots. Physical Review B. Volume 58, Issue 24. P. R15993-R15996. ISSN 1098-0121 (printed). DOI: 10.1103/physrevb.58.r15993. | en |
dc.identifier.doi | 10.1103/physrevb.58.r15993 | |
dc.identifier.issn | 1098-0121 (printed) | |
dc.identifier.uri | https://aaltodoc.aalto.fi/handle/123456789/16048 | |
dc.identifier.urn | URN:NBN:fi:aalto-201505152698 | |
dc.language.iso | en | en |
dc.publisher | American Physical Society (APS) | en |
dc.relation.ispartofseries | Physical Review B | en |
dc.relation.ispartofseries | Volume 58, Issue 24 | |
dc.rights | © 1998 American Physical Society (APS). http://www.aps.org/ | en |
dc.rights.holder | American Physical Society (APS) | |
dc.subject.keyword | carrier relaxation | en |
dc.subject.keyword | quantum dots | en |
dc.subject.other | Physics | en |
dc.title | Temperature dependence of carrier relaxation in strain-induced quantum dots | en |
dc.type | A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä | fi |
dc.type.dcmitype | text | en |
dc.type.version | Final published version | en |
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