Temperature dependence of carrier relaxation in strain-induced quantum dots

dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorBraskén, M.
dc.contributor.authorLindberg, M.
dc.contributor.authorSopanen, Markku
dc.contributor.authorLipsanen, Harri
dc.contributor.authorTulkki, J.
dc.contributor.departmentDepartment of Micro and Nanosciencesen
dc.contributor.departmentMikro- ja nanotekniikan laitosfi
dc.contributor.schoolSähkötekniikan korkeakoulufi
dc.contributor.schoolSchool of Electrical Engineeringen
dc.date.accessioned2015-05-15T09:01:04Z
dc.date.available2015-05-15T09:01:04Z
dc.date.issued1998
dc.description.abstractWe report experimental observation and theoretical interpretation of temperature-dependent, time-resolved luminescence from strain-induced quantum dots. The experimental results are well described by a master equation model for the electrons. The intraband relaxation in the conduction band and the radiative recombination rate are governed by the hole populations resulting in prominent temperature dependence of the relaxation process. Even when only a few electrons and holes are confined in a single quantum dot the Auger-like process provides a rapid intraband relaxation channel for electrons that can replace the phonon scattering as the dominant relaxation mechanism.en
dc.description.versionPeer revieweden
dc.format.extentR15993-R15996
dc.format.mimetypeapplication/pdfen
dc.identifier.citationBraskén, M. & Lindberg, M. & Sopanen, M. & Lipsanen, Harri & Tulkki, J.. 1998. Temperature dependence of carrier relaxation in strain-induced quantum dots. Physical Review B. Volume 58, Issue 24. P. R15993-R15996. ISSN 1098-0121 (printed). DOI: 10.1103/physrevb.58.r15993.en
dc.identifier.doi10.1103/physrevb.58.r15993
dc.identifier.issn1098-0121 (printed)
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/16048
dc.identifier.urnURN:NBN:fi:aalto-201505152698
dc.language.isoenen
dc.publisherAmerican Physical Society (APS)en
dc.relation.ispartofseriesPhysical Review Ben
dc.relation.ispartofseriesVolume 58, Issue 24
dc.rights© 1998 American Physical Society (APS). http://www.aps.org/en
dc.rights.holderAmerican Physical Society (APS)
dc.subject.keywordcarrier relaxationen
dc.subject.keywordquantum dotsen
dc.subject.otherPhysicsen
dc.titleTemperature dependence of carrier relaxation in strain-induced quantum dotsen
dc.typeA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessäfi
dc.type.dcmitypetexten
dc.type.versionFinal published versionen

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