Shot noise and conductivity at high bias in bilayer graphene
dc.contributor | Aalto-yliopisto | fi |
dc.contributor | Aalto University | en |
dc.contributor.author | Fay, A. | |
dc.contributor.author | Danneau, R. | |
dc.contributor.author | Viljas, J. K. | |
dc.contributor.author | Wu, F. | |
dc.contributor.author | Tomi, M. Y. | |
dc.contributor.author | Wengler, J. | |
dc.contributor.author | Wiesner, M. | |
dc.contributor.author | Hakonen, P. J. | |
dc.contributor.department | Department of Applied Physics | |
dc.date.accessioned | 2018-05-22T14:28:56Z | |
dc.date.available | 2018-05-22T14:28:56Z | |
dc.date.issued | 2011-12-14 | |
dc.description.abstract | We have studied electronic conductivity and shot noise of bilayer graphene (BLG) sheets at high bias voltages and low bath temperature T 0=4.2 K. As a function of bias, we find initially an increase of the differential conductivity, which we attribute to self-heating. At higher bias, the conductivity saturates and even decreases due to backscattering from optical phonons. The electron-phonon interactions are also responsible for the decay of the Fano factor at bias voltages V>0.1 V. The high bias electronic temperature has been calculated from shot-noise measurements, and it goes up to ∼1200 K at V=0.75 V. Using the theoretical temperature dependence of BLG conductivity, we extract an effective electron-optical phonon scattering time τ e-op. In a 230-nm-long BLG sample of mobility μ=3600 cm2V -1s -1, we find that τ e-op decreases with increasing voltage and is close to the charged impurity scattering time τ imp=60 fs at V=0.6 V. | en |
dc.description.version | Peer reviewed | en |
dc.format.extent | 7 | |
dc.format.extent | 1-7 | |
dc.format.mimetype | application/pdf | |
dc.identifier.citation | Fay , A , Danneau , R , Viljas , J K , Wu , F , Tomi , M Y , Wengler , J , Wiesner , M & Hakonen , P J 2011 , ' Shot noise and conductivity at high bias in bilayer graphene : Signatures of electron-optical phonon coupling ' , Physical Review B , vol. 84 , no. 24 , 245427 , pp. 1-7 . https://doi.org/10.1103/PhysRevB.84.245427 | en |
dc.identifier.doi | 10.1103/PhysRevB.84.245427 | |
dc.identifier.issn | 1098-0121 | |
dc.identifier.issn | 1550-235X | |
dc.identifier.other | PURE UUID: 0fec14ee-e0d3-4da4-94cc-9a9e44e44def | |
dc.identifier.other | PURE ITEMURL: https://research.aalto.fi/en/publications/0fec14ee-e0d3-4da4-94cc-9a9e44e44def | |
dc.identifier.other | PURE LINK: http://www.scopus.com/inward/record.url?scp=84855417493&partnerID=8YFLogxK | |
dc.identifier.other | PURE FILEURL: https://research.aalto.fi/files/14384712/PhysRevB.84.245427.pdf | |
dc.identifier.uri | https://aaltodoc.aalto.fi/handle/123456789/30757 | |
dc.identifier.urn | URN:NBN:fi:aalto-201805222197 | |
dc.language.iso | en | en |
dc.relation.ispartofseries | PHYSICAL REVIEW B | en |
dc.relation.ispartofseries | Volume 84, issue 24 | en |
dc.rights | openAccess | en |
dc.title | Shot noise and conductivity at high bias in bilayer graphene | en |
dc.type | A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä | fi |
dc.type.version | publishedVersion |