Lock-in thermography approach for imaging the efficiency of light emitters and optical coolers

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A4 Artikkeli konferenssijulkaisussa
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Date

2017

Department

Department of Neuroscience and Biomedical Engineering

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Language

en

Pages

7

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Optical and Electronic Cooling of Solids II, pp. 1-7, Proceedings of SPIE ; Volume 10121

Abstract

Developing optical cooling technologies requires access to reliable efficiency measurement techniques and ability to detect spatial variations in the efficiency and light emission of the devices. We investigate the possibility to combine the calorimetric efficiency measurement principles with lock-in thermography (LIT) and conventional luminescence microscopy to enable spatially resolved measurement of the efficiency, current spreading and local device heating of double diode structures (DDS) serving as test vessels for developing thermophotonic cooling devices. Our approach enables spatially resolved characterization and localization of the losses of the double diode structures as well as other light emitting semiconductor devices. In particular, the approach may allow directly observing effects like current crowding and surface recombination on the light emission and heating of the DDS devices.

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Keywords

double diode structures, efficiency nonuniformity, electroluminescent cooling, III-V semiconductors, lock-in thermography, quantum efficiency, radiative and non-radiative recombination, surface states

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DOI

10.1117/12.2249978

Citation

Radevici, I, Tiira, J & Oksanen, J 2017, Lock-in thermography approach for imaging the efficiency of light emitters and optical coolers. in R I Epstein, D V Seletskiy & M Sheik-Bahae (eds), Optical and Electronic Cooling of Solids II., 101210Q, Proceedings of SPIE, vol. 10121, SPIE, pp. 1-7, Optical and Electronic Cooling of Solids, San Francisco, California, United States, 01/02/2017. https://doi.org/10.1117/12.2249978

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https://urn.fi/URN:NBN:fi:aalto-202510087852

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[article-cris] Perustieteiden korkeakoulu / SCI