Site-specific force-distance characteristics on NaCl(001): Measurements versus atomistic simulations
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© 2006 American Physical Society (APS). This is the accepted version of the following article: Lantz, M. A. & Hoffmann, R. & Foster, Adam S. & Baratoff, A. & Hug, H. J. & Hidber, H. R. & Güntherodt, H.-J. 2006. Site-specific force-distance characteristics on NaCl(001): Measurements versus atomistic simulations. Physical Review B. Volume 74, Issue 24. 245426/1-9. ISSN 1550-235X (electronic). DOI: 10.1103/physrevb.74.245426, which has been published in final form at http://journals.aps.org/prb/abstract/10.1103/PhysRevB.74.245426.
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School of Science |
A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
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Date
2006
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Degree programme
Language
en
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245426/1-9
Series
Physical Review B, Volume 74, Issue 24
Abstract
A scanning force microscope was used to measure the frequency shift above various atomic sites on a NaCl(001) surface at 7K. The data was converted to force and compared to the results of atomistic simulations using model NaCl and MgO tips. We find that the NaCl tip demonstrates better agreement in the magnitude of the forces in experiments, supporting the observation that the tip first came into contact with the sample. Using the MgO tip as a model of the originally oxidized silicon tip, we further demonstrate a possible mechanism for tip contamination at low temperatures.Description
Keywords
AFM, NaCl, experiments, theory
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Citation
Lantz, M. A. & Hoffmann, R. & Foster, Adam S. & Baratoff, A. & Hug, H. J. & Hidber, H. R. & Güntherodt, H.-J. 2006. Site-specific force-distance characteristics on NaCl(001): Measurements versus atomistic simulations. Physical Review B. Volume 74, Issue 24. 245426/1-9. ISSN 1550-235X (electronic). DOI: 10.1103/physrevb.74.245426.