Manipulation of Ag nanoparticles utilizing noncontact atomic force microscopy

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© 1998 AIP Publishing. This article may be downloaded for personal use only. Any other use requires prior permission of the authors and the American Institute of Physics. The following article appeared in Applied Physics Letters, Volume 73, Issue 11 and may be found at http://scitation.aip.org/content/aip/journal/apl/73/11/10.1063/1.122187.
Journal Title
Journal ISSN
Volume Title
School of Science | A1 Alkuperäisartikkeli tieteellisessä aikakauslehdessä
Date
1998
Major/Subject
Mcode
Degree programme
Language
en
Pages
1505-1507
Series
Applied Physics Letters, Volume 73, Issue 11
Abstract
We have developed a scheme to manipulate metallic aerosol particles on silicon dioxide substrates using an atomic force microscope. The method utilizes the noncontact mode both for locating and moving nanoparticles of size 10–100 nm. The main advantage of our technique is the possibility of “seeing” the moving particle in real time. Our method avoids well sticking problems that typically hamper the manipulation in the contact mode.
Description
Keywords
Ag nanoparticles, atomic force microscopes
Other note
Citation
Martin, M. & Roschier, L. & Hakonen, Pertti J. & Parts, U. & Paalanen, M. & Schleicher, B. & Kauppinen, E. I.. 1998. Manipulation of Ag nanoparticles utilizing noncontact atomic force microscopy. Applied Physics Letters. Volume 73, Issue 11. 1505-1507. ISSN 0003-6951 (printed). DOI: 10.1063/1.122187