Chemical Identification of Ions in Doped NaCl by Scanning Force Microscopy

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dc.contributorAalto-yliopistofi
dc.contributorAalto Universityen
dc.contributor.authorFoster, Adam S.
dc.contributor.authorBarth, Clemens
dc.contributor.authorHenry, Claude R.
dc.contributor.departmentDepartment of Applied Physicsen
dc.contributor.groupauthorSurfaces and Interfaces at the Nanoscaleen
dc.date.accessioned2025-10-08T07:43:14Z
dc.date.available2025-10-08T07:43:14Z
dc.date.issued2009
dc.description.abstractA quantitative comparison between experiment and theory is presented, which shows that all ions of the Suzuki structure on (001) surfaces of Mg2+ or Cd2+ doped NaCl crystals can be identified despite the tip-surface distance, differences in impurity chemistry, and surface termination. The identification can be used to calibrate the potential of the tip’s last atom, and it is proposed to use these surfaces for better characterization of deposited nano-objects.en
dc.description.versionPeer revieweden
dc.format.extent4
dc.format.mimetypeapplication/pdf
dc.identifier.citationFoster, A S, Barth, C & Henry, C R 2009, 'Chemical Identification of Ions in Doped NaCl by Scanning Force Microscopy', Physical Review Letters, vol. 102, no. 25, 256103, pp. 1-4. https://doi.org/10.1103/PhysRevLett.102.256103en
dc.identifier.doi10.1103/PhysRevLett.102.256103
dc.identifier.issn0031-9007
dc.identifier.issn1079-7114
dc.identifier.otherPURE UUID: e525295f-87b5-417f-a320-c7f3447e3adb
dc.identifier.otherPURE ITEMURL: https://research.aalto.fi/en/publications/e525295f-87b5-417f-a320-c7f3447e3adb
dc.identifier.otherPURE LINK: http://link.aps.org/abstract/PRL/v102/e256103
dc.identifier.otherPURE FILEURL: https://research.aalto.fi/files/14755053/PhysRevLett.102.256103.pdf
dc.identifier.urihttps://aaltodoc.aalto.fi/handle/123456789/139915
dc.identifier.urnURN:NBN:fi:aalto-202510088096
dc.language.isoenen
dc.publisherAmerican Physical Society
dc.relation.ispartofseriesPhysical Review Lettersen
dc.relation.ispartofseriesVolume 102, issue 25, pp. 1-4en
dc.rightsopenAccessen
dc.subject.keywordAFM
dc.titleChemical Identification of Ions in Doped NaCl by Scanning Force Microscopyen
dc.typeA1 Alkuperäisartikkeli tieteellisessä aikakauslehdessäfi
dc.type.versionpublishedVersion

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